STM8S003F3 datasheet(84/104 Pages) STMICROELECTRONICS

Part #	STM8S003F3

Description	Extended instruction set

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Manufacturer	STMICROELECTRONICS [STMicroelectronics]

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Electrical characteristics

STM8S003F3 STM8S003K3

84/104

DocID018576 Rev 9

Figure 42. ADC accuracy characteristics

1. Example of an actual transfer curve.

2. The ideal transfer curve

3. End point correlation line

ET = Total unadjusted error: maximum deviation between the actual and the ideal transfer curves.

EO = Offset error: deviation between the first actual transition and the first ideal one.

EG = Gain error: deviation between the last ideal transition and the last actual one.

ED = Differential linearity error: maximum deviation between actual steps and the ideal one.

EL = Integral linearity error: maximum deviation between any actual transition and the end point correlation

line.

Figure 43. Typical application with ADC

EO

EG

1LSBIDEAL

VDDA VSSA

–

1024

-----------------------------------------

=

1023

1022

1021

5

4

3

2

1

0

7

6

1

2

345

67

1021102210231024

(1)

(2)

ET

ED

EL

(3)

VDDA

VSSA

AINx

STM8

VDD

IL

±1µA

VT

0.6V

VT

0.6V

CADC

VAIN

RAIN

10-bit A/D

conversion

CAIN

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