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85222AMLF Datasheet(PDF) 3 Page - Integrated Device Technology

Part # 85222AMLF
Description  Dual LVCMOS / LVTTL-TO-Differential
PDF  13 Pages
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

85222AMLF Datasheet(HTML) 3 Page - Integrated Device Technology

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REVISION C 5/7/15
85222 DATA SHEET
3
DUAL LVCMOS / LVTTL-TO-DIFFERENTIAL
LVHSTL TRANSLATOR
TABLE 3A. POWER SUPPLY DC CHARACTERISTICS, V
DD = 3.3V±5%, VDD = 2.5V±5%, T
A
= 0°C TO 70°C
TABLE 3B. LVCMOS / LVTTL DC CHARACTERISTICS, V
DD = 3.3V±5%, VDD = 2.5V±5%, T
A
= 0°C TO 70°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
V
DD
Positive Supply Voltage
3.135
3.3
3.465
V
V
DD
Positive Supply Voltage
2.375
2.5
2.625
V
I
DD
Power Supply Current
45
mA
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
V
IH
Input High Voltage
CLK0, CLK1
2
V
DD + 0.3
V
V
IL
Input Low Voltage
CLK0, CLK1
-0.3
1.3
V
I
IH
Input High Current
CLK0, CLK1
V
DD = VIN = 3.465V,
V
DD = VIN = 2.625V
150
µA
I
IL
Input Low Current
CLK0, CLK1
V
DD = VIN = 3.465V,
V
DD = VIN = 2.625V
-5
µA
TABLE 3C. LVHSTL DC CHARACTERISTICS, V
DD = 3.3V±5%, VDD = 2.5V±5%, T
A
= 0°C TO 70°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
V
OH
Output High Voltage; NOTE 1
1
1.2
V
V
OL
Output Low Voltage; NOTE 1
V
DD = 3.3V ± 5%
0
0.4
V
V
DD = 2.5V ± 5%
0
0.55
V
V
SWING
Peak-to-Peak Output Voltage Swing
V
DD = 3.3V ± 5%
0.6
1.2
V
V
DD = 2.5V ± 5%
0.45
1.2
V
NOTE 1: Outputs terminated with 50
Ω to GND.
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V
DD
4.6V
Inputs, V
I
-0.5V to V
DD + 0.5V
Outputs, I
O
Continuous Current
50mA
Surge Current
100mA
Package Thermal Impedance,
θ
JA
112.7°C/W (0 lfpm)
Storage Temperature, T
STG
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device.These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions
beyond those listed in the DC Characteristics or AC Charac-
teristics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.



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