V. Quality Assurance Information

A. Quality Assurance Contacts:

Jim Pedicord

(Reliablity Lab Manager)

Bryan Preeshl

(Executive Director of QA)

Kenneth Huening

(Vice President)

B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.

0.1% For all Visual Defects.

C. Observed Outgoing Defect Rate: < 50 ppm

D. Sampling Plan: Mil-Std-105D

VI. Reliability Evaluation

A. Accelerated Life Test

The results of the 135

°C biased (static) life test are shown in Table 1. Using these results, the Failure

Rate (

λ) is calculated as follows:

λ =

1

=

1.83

(Chi square value for MTTF upper limit)

MTTF

192 x 4389 x 134 x 2

Thermal acceleration factor assuming a 0.8eV activation energy

λ= 8.10 F.I.T. (60% confidence level @ 25°C)

This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.

Maxim also performs weekly Burn-In on samples from production to assure the reliability of its processes. The

reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates

to 3 failures in an 80 piece sample. Maxim performs failure analysis on lots exceeding this level. The following

Burn-In Schematic (Spec. #06-5924) shows the static circuit used for this test. Maxim also performs 1000 hour

life test monitors quarterly for each process. This data is published in the Product Reliability Report (RR-1M).

B. Moisture Resistance Tests

Maxim evaluates pressure pot stress from every assembly process during qualification of each new

design.

Pressure Pot testing must pass a 20% LTPD for acceptance.

Additionally, industry standard

85

°C/85%RH or HAST tests are performed quarterly per device/package family.

C. E.S.D. and Latch-Up Testing

The PM02 die type has been found to have all pins able to withstand a transient pulse of 1000V, per Mil-

Std-883 Method 3015 (reference attached ESD Test Circuit).

Latch-Up testing has shown that this device

withstands a current of

±250mA.