Attachment #1

TABLE II. Pin combination to be tested. 1/ 2/

1/ Table II is restated in narrative form in 3.4 below.

2/ No connects are not to be tested.

3/ Repeat pin combination I for each named Power supply and for ground

3.4

Pin combinations to be tested.

a.

Each pin individually connected to terminal A with respect to the device ground pin(s) connected

to terminal B. All pins except the one being tested and the ground pin(s) shall be open.

b.

Each pin individually connected to terminal A with respect to each different set of a combination

terminal B. All pins except the one being tested and the power supply pin or set of pins shall be

open.

c.

Each input and each output individually connected to terminal A with respect to a combination of

all the other input and output pins connected to terminal B. All pins except the input or output pin

being tested and the combination of all the other input and output pins shall be open.

Terminal A

(Each pin individually

connected to terminal A

with the other floating)

Terminal B

(The common combination

of all like-named pins

connected to terminal B)

1.

2.

All input and output pins

All other input-output pins

Mil Std 883D

Method 3015.7

Notice 8

REGULATED

HIGH VOLTAGE

SUPPLY

TERMINAL D

DUT

SOCKET

TERMINAL C

TERMINAL B

TERMINAL A

CURRENT

PROBE

(NOTE 6)

R = 1.5k

Ω

C = 100pf

SHORT

R2

S2

S1

R1

C1