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TMS44100P Datasheet(PDF) 9 Page - Texas Instruments

Part # TMS44100P
Description  4194304-WORD BY 1-BIT DYNAMIC RANDOM-ACCESS MEMORIES
PDF  25 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TMS44100P Datasheet(HTML) 9 Page - Texas Instruments

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TMS44100, TMS44100P, TMS46100, TMS46100P
4194304-WORD BY 1-BIT
DYNAMIC RANDOM-ACCESS MEMORIES
SMHS561A – MARCH 1995 – REVISED JUNE 1995
9
POST OFFICE BOX 1443
• HOUSTON, TEXAS 77251–1443
timing requirements over recommended ranges of supply voltage and operating free-air
temperature
’4x100 - 60
’4x100P - 60
’4x100 - 70
’4x100P - 70
’4x100 - 80
’4x100P - 80
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
tRC
Cycle time, random read or write (see Note 8)
110
130
150
ns
tRWC
Cycle time, read-write (see Note 8)
130
153
175
ns
tPC
Cycle time, page-mode read or write (see Notes 8 and 9)
40
45
50
ns
tPRWC
Cycle time, page-mode read-write (see Note 8)
60
68
75
ns
tRASP
Pulse duration, RAS low, page mode (see Note 10)
60
100 000
70
100 000
80
100 000
ns
tRAS
Pulse duration, RAS low, nonpage mode (see Note 10)
60
10 000
70
10 000
80
10 000
ns
tRASS
Pulse duration, RAS low, self refresh
100
100
100
µs
tCAS
Pulse duration, CAS low, (see Note 11)
15
10 000
18
10 000
20
10 000
ns
tCP
Pulse duration, CAS high
10
10
10
ns
tRP
Pulse duration, RAS high (precharge)
40
50
60
ns
tRPS
Precharge time after self refresh using RAS
140
130
150
ns
tWP
Pulse duration, write
10
10
10
ns
tASC
Setup time, column address before CAS low
0
0
0
ns
tASR
Setup time, row address before RAS low
0
0
0
ns
tDS
Setup time, data (see Note 12)
0
0
0
ns
tRCS
Setup time, W high before CAS low
0
0
0
ns
tCWL
Setup time, W low before CAS high
15
18
20
ns
tRWL
Setup time, W low before RAS high
15
18
20
ns
tWCS
Setup time, W low before CAS low (early-write operation only)
0
0
0
ns
tWSR
Setup time, W high (CBR refresh only)
10
10
10
ns
tWTS
Setup time, W low (test mode only)
10
10
10
ns
tCAH
Hold time, column address after CAS low
10
15
15
ns
tDHR
Hold time, data after RAS low (see Note 13)
50
55
60
ns
tDH
Hold time, data (see Note 12)
10
15
15
ns
tAR
Hold time, column address after RAS low (see Note 13)
50
55
60
ns
tRAH
Hold time, row address after RAS low
10
10
10
ns
tRCH
Hold time, W high after CAS high (see Note 14)
0
0
0
ns
tRRH
Hold time, W high after RAS high (see Note 14)
0
0
0
ns
tWCH
Hold time, W low after CAS low (early-write operation only)
10
15
15
ns
tWCR
Hold time, W low after RAS low (see Note 13)
50
55
60
ns
tWHR
Hold time, W high (CBR refresh only)
10
10
10
ns
tWTH
Hold time, W low (test mode only)
10
10
10
ns
tAWD
Delay time, column address to W low
(read-write operation only)
30
35
40
ns
tCHR
Delay time, RAS low to CAS high (CBR refresh only)
10
10
10
ns
tCRP
Delay time, CAS high to RAS low
0
0
0
ns
tCSH
Delay time, RAS low to CAS high
60
70
80
ns
NOTES:
8. All cycle times assume tT = 5 ns.
9. To assure tPC min, tASC should be ≥ 5 ns.
10. In a read-write cycle, tRWD and tRWL must be observed.
11. In a read-write cycle, tCWD and tCWL must be observed.
12. Referenced to the later of CAS or W in write operations
13. The minimum value is measured when tRCD is set to tRCD min as a reference.
14. Either tRRH or tRCH must be satisfied for a read cycle.



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