Preliminary Technical Data

AD5040/AD5060

Rev. PrC | Page 7 of 17

TERMINOLOGY

Relative Accuracy

For the DAC, relative accuracy or Integral Nonlinearity (INL)

is ameasureofthemaximumdeviation,inLSBs,fromastraight line

passing through the endpoints of the DAC transfer function. A

typical INL vs. code plot can be seen in Figure 2.

Differential Nonlinearity

Differential Nonlinearity (DNL) is the difference between the

measured change and the ideal 1 LSB change between any two

adjacent codes. A specified differential nonlinearity of ±1 LSB

maximum ensures monotonicity. This DAC is

guaranteed monotonic by design. A typical DNL vs. code plot

can be seen in Figure 3.

Zero-Code Error

Zero-code error is a measure of the output error when zero

code (0000Hex) is loaded to the DAC register. Ideally the

output should be 0 V. The zero-code error is always positive in

the AD5040/AD5060 because the output of the DAC cannot go

below 0 V. It is due to a combination of the offset errors in the

DAC and output amplifier. Zero-code error is expressed in mV.

A plot of zero-code error vs. temperature can be seen in Figure

6.

Full-Scale Error

Full-scale error is a measure of the output error when full-scale

code (FFFF Hex) is loaded to the DAC register. Ideally the

output should be VDD – 1 LSB. Full-scale error is expressed in

percent of full-scale range. A plot of full-scale error vs.

temperature can be seen in Figure 6.

Gain Error

This is a measure of the span error of the DAC. It is the

deviation in slope of the DAC transfer characteristic from ideal

expressed as a percent of the full-scale range.

Total Unadjusted Error

Total Unadjusted Error (TUE) is a measure of the output error

taking all the various errors into account. A typical TUE vs.

code plot can be seen in Figure 4.

Zero-Code Error Drift

This is a measure of the change in zero-code error

with a change in temperature. It is expressed in µV/°C.

Gain Error Drift

This is a measure of the change in gain error with changes in

temperature. It is expressed in (ppm of full-scale range)/°C.

Digital-to-Analog Glitch Impulse

Digital-to-analog glitch impulse is the impulse injected into the

analog output when the input code in the DAC register changes

state. It is normally specified as the area of the glitch in nV secs

and is measured when the digital input code is

changed by

1 LSB at the major carry transition (7FFF Hex to 8000 Hex). See

Figure 19.

Digital Feedthrough

Digital feedthrough is a measure of the impulse injected into

the analog output of the DAC from the digital inputs of the

DAC but is measured when the DAC output is not updated. It

is specified in nV secs and measured with a full-scale

code change on the data bus, i.e., from all 0s to all 1s and vice

versa.