TLV5734 datasheet(13/17 Pages) TI

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TLV5734

TRIPLE 8BIT 30MSPS ADC WITH HIGH

PRECISION CLAMP FOR YUV/RGB VIDEO

SLES026A – APRIL 2002 – REVISED JANUARY 2003

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

electrical characteristics at VDD = VCC = 3.3 V, Vref(RT) = 2.0 V, Vref(RB) = 1.0 V, f(CLK) = 30 MHz,

TA = 25°C (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Clamp level accuracy

±0.5

±1

LSB

RREF

Reference resistance

Measured between RT and RB

450

Ω

Analog input capacitance

IIH

High-level digital input current

VIH = VDD + 0.3 V

µA

IIL

Low-level digital input current

VIL = 0 V

µA

VOH

High-level digital output voltage

VDD = 3 V to 3.6 V, IOH = –50 µA

VDD–0.7

VOL

Low-level digital output voltage

VDD = 3 V to 3.6 V, IOL = 50 µA

0.5

IOH(lkg)

High-level digital output leakage current

OEB A = OEB B = OEB C = HI, VOH = VDD

µA

IOL(lkg)

Low-level digital output leakage current

OEB A = OEB B = OEB C = HI, VOL = 0 V

µA

Supply current

fS = 30 MSPS, NTSC ramp wave input

Power dissipation

fS = 30 MSPS, NTSC ramp wave input

240

270

300

operating characteristics VDD = VCC = 3.3 V, Vref(RT) = 2.0 V, Vref(RB) = 1.0 V, f(CLK) = 30 MHz,

TA = –20°C to 75°C (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

DNL

Differential nonlinearity

fS = 30 MSPS

±0.2

±0.5

LSB

INL

Integral nonlinearity

fS = 30 MSPS

±0.3 ±0.75

LSB

Maximum conversion rate

MSPS

Analog input bandwidth

At –3 dB, TA = 25°C

130

MHz

tpd

Digital output delay time

CL = 10 pF (by design)

Zero-scale error

Vref = REFT – REFB = 1 V

–16

–2

Full-scale error

Vref = REFT – REFB = 1 V

–13

Sampling delay time

By design

4.3

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