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LTM4613 Datasheet(PDF) 19 Page - Linear Technology |
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LTM4613 Datasheet(HTML) 19 Page - Linear Technology |
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19 / 30 page ![]() LTM4649 19 4649fc For more information www.linear.com/LTM4649 APPLICATIONS INFORMATION the bottom of the part through the solder joints and through a portion of the board. The board temperature is measured a specified distance from the package. A graphical representation of the aforementioned ther- mal resistances is given in Figure 8; blue resistances are contained within the μModule regulator, whereas green resistances are external to the µModule package. As a practical matter, it should be clear to the reader that no individual or sub-group of the four thermal resistance parameters defined by JESD51-12 or provided in the Pin Configuration section replicates or conveys normal oper- ating conditions of a μModule regulator. For example, in normal board-mounted applications, never does 100% of the device’s total power loss (heat) thermally conduct exclusively through the top or exclusively through bot- tom of the µModule package—as the standard defines for θJCtop and θJCbottom, respectively. In practice, power loss is thermally dissipated in both directions away from the package—granted, in the absence of a heat sink and airflow, a majority of the heat flow is into the board. Within the LTM4649, be aware there are multiple power devices and components dissipating power, with a con- sequence that the thermal resistances relative to different junctions of components or die are not exactly linear with respect to total package power loss. To reconcile this complication without sacrificing modeling simplicity— but also, not ignoring practical realities—an approach has been taken using FEA software modeling along with laboratory testing in a controlled-environment chamber to reasonably define and correlate the thermal resistance valuessuppliedinthisdatasheet:(1)Initially,FEAsoftware is used to accurately build the mechanical geometry of the LTM4649 and the specified PCB with all of the cor- rect material coefficients along with accurate power loss source definitions; (2) this model simulates a software- defined JEDEC environment consistent with JESD51-12 to predict power loss heat flow and temperature readings at different interfaces that enable the calculation of the JEDEC-defined thermal resistance values; (3) the model and FEA software is used to evaluate the LTM4649 with heat sink and airflow; (4) having solved for and analyzed these thermal resistance values and simulated various operating conditions in the software model, a thorough laboratory evaluation replicates the simulated conditions with thermocouples within a controlled-environment chamber while operating the device at the same power loss as that which was simulated. The outcome of this process and due diligence yields the set of derating curves shown in this data sheet. After these laboratory tests have been performed and correlated to the LTM4649 model, then the θJB and θBA values are summed together to correlate quite well with the µModule model for θJA with Figure 8. Graphical Representation of JESD51-12 Thermal Coefficients 4649 F08 µMODULE DEVICE JUNCTION-TO-CASE (TOP) RESISTANCE JUNCTION-TO-BOARD RESISTANCE JUNCTION-TO-AMBIENT THERMAL RESISTANCE COMPONENTS CASE (TOP)-TO-AMBIENT RESISTANCE BOARD-TO-AMBIENT RESISTANCE JUNCTION-TO-CASE (BOTTOM) RESISTANCE JUNCTION AMBIENT CASE (BOTTOM)-TO-BOARD RESISTANCE |
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