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MMRF2007N Datasheet(PDF) 3 Page - NXP Semiconductors

Part # MMRF2007N
Description  RF LDMOS Wideband Integrated Power Amplifiers
PDF  17 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MMRF2007N Datasheet(HTML) 3 Page - NXP Semiconductors

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MMRF2007N MMRF2007GN
3
RF Device Data
Freescale Semiconductor, Inc.
Table 5. Electrical Characteristics (TA =25C unless otherwise noted) (continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Stage 2 — Off Characteristics (1)
Zero Gate Voltage Drain Leakage Current
(VDS =70 Vdc, VGS =0 Vdc)
IDSS
—
—
10
Adc
Zero Gate Voltage Drain Leakage Current
(VDS =28 Vdc, VGS =0 Vdc)
IDSS
—
—
1
Adc
Gate--Source Leakage Current
(VGS =1.5 Vdc, VDS =0 Vdc)
IGSS
—
—
1
Adc
Stage 2 — On Characteristics (1)
Gate Threshold Voltage
(VDS =10 Vdc, ID = 320 Adc)
VGS(th)
1.2
2.0
2.7
Vdc
Gate Quiescent Voltage
(VDS =25 Vdc, IDQ2(A+B) = 550 mAdc)
VGS(Q)
—
3.1
—
Vdc
Fixture Gate Quiescent Voltage
(VDD2 =25 Vdc, IDQ2(A+B) = 550 mAdc, Measured in Functional Test)
VGG(Q)
7.6
8.6
9.6
Vdc
Drain--Source On--Voltage
(VGS =10 Vdc, ID =3.2 Adc)
VDS(on)
0.1
0.48
1.2
Vdc
Functional Tests (1,2,3) (In Freescale Test Fixture, 50 ohm system) VDD1 =28 Vdc, VDD2 =25 Vdc, IDQ1(A+B) =60 mA, IDQ2(A+B) = 550 mA,
Pout = 35 W Avg., f1 = 939.9 MHz, f2 = 940.1 MHz
Power Gain
Gps
31.5
32.6
36.5
dB
Power Added Efficiency
PAE
40.5
42.1
—
%
Intermodulation Distortion
IMD
—
–31.3
–29.0
dBc
Typical Performance (1) (In Freescale Test Fixture, 50 ohm system) VDD1 =28 Vdc, VDD2 =25 Vdc, IDQ1(A+B) =60 mA,
IDQ2(A+B) = 550 mA, 850–940 MHz Bandwidth
Characteristic
Symbol
Min
Typ
Max
Unit
Pout @ 1 dB Compression Point, CW
P1dB
—
79
—
W
IMD Symmetry @ 71 W PEP, Pout where IMD Third Order Intermodulation
30 dBc
(Delta IMD Third Order Intermodulation between Upper and Lower
Sidebands > 2 dB)
IMDsym
—
22
—
MHz
VBW Resonance Point
(IMD Third Order Intermodulation Inflection Point)
VBWres
—
50
—
MHz
Quiescent Current Accuracy over Temperature
Stage 1
with 8.25 k Gate Feed Resistors (–30 to 85C) (4)
Stage 2
IQT
—
—
5.03
4.61
—
—
%
Gain Flatness in 90 MHz Bandwidth @ Pout =35 W Avg.
GF
—
1.2
—
dB
Gain Variation over Temperature
(–30Cto+85C)
G
—
0.03
—
dB/C
Output Power Variation over Temperature
(–30Cto+85C)
P1dB
—
0.005
—
dB/C
Table 6. Ordering Information
Device
Tape and Reel Information
Package
MMRF2007NR1
R1 Suffix = 500 Units, 44 mm Tape Width, 13--inch Reel
TO--270WBL--16
MMRF2007GNR1
TO--270WBLG--16
1. Side A and Side B are tied together for this measurement.
2. Part internally matched both on input and output.
3. Measurements made with device in straight lead configuration before any lead forming operation is applied. Lead forming is used for gull wing
(GN) parts.
4. Refer to AN1977, Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family, and to AN1987, Quiescent Current Control
for the RF Integrated Circuit Device Family. Go to http://www.freescale.com/rf and search for AN1977 or AN1987.



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