Passive interconnect test

Finally, with its exceptional signal fidelity and resolution, the DSA8300 is

the gold standard for electrical and optical applications which require ultra-

high bandwidths, very fine vertical resolution, low jitter, and/or exceptionally

low noise.

The DSA8300 provides unmatched measurement system fidelity with the

lowest native instrument jitter floor (425 fs RMS, typical for serial data

signals at rates >1.25 Gb/s) that ensures the most accurate acquisition of

up to 8 high-bandwidth signals simultaneously. You get additional analysis

benefits from acquisition jitter below 100 fs RMS when using the 82A04B

Phase Reference module.

The multiprocessor architecture, with dedicated per-slot digital signal

processors (DSPs), provides fast waveform acquisition rates, reducing the

test times necessary for reliable characterization and compliance

verification.

The DSA8300’s versatile modular architecture supports a large and

growing family of plug-ins enabling you to configure your measurement

system with a wide variety of electrical, optical, and accessory modules that

best suit your application now and in the future. With 6 module slots, the

DSA8300 can simultaneously accommodate a Clock Recovery module, a

precision Phase Reference module, and multiple acquisition modules

(electrical or optical), so you can match system performance to your

evolving needs. The ability to swap sampling modules without powering

down the DSA8300 (available for scopes with firmware versions 6.1 and

later) provides additional flexibility in configuring your DSA8300 to changing

test needs.

In addition, specialized modules supporting features such as single-ended

and differential electrical clock recovery, electrostatic protection for

electrical samplers, and connectivity to the popular TekConnect

system brings you the performance of state-of-the-art Tektronix probes for

high-impedance and differential probing. Low-impedance probes for 50 Ω

probing and for TDR probing are also available.

The raw acquisition performance of the DSA8300 and its sampling modules

and accessories is further augmented by the comprehensive measurement

and analysis capabilities of the DSA8300 and its associated software

applications.

See the Ordering information for a list of currently available software

applications and modules.

Measurement and analysis tools for optical

testing applications

The DSA8300 includes a wide variety of measurement and analysis tools

which specifically address optical testing applications. In addition to the

standard amplitude and timing parametric measurements (such as rise/fall

times, amplitude, RMS jitter, RMS noise, frequency, period, and so on), the

measurement suite for the DSA8300 includes measurements specifically

tailored to measuring optical signals (average optical power, extinction

ratio, eye height, eye width, optical modulation amplitude (OMA), and so

on). For a complete list of measurements, see the Measurement section of

this datasheet.

The DSA8300 also includes standard compliance testing masks for all of

the common optical standards from 155 Mb/s to 100 Gb/s. The DSA8300

mask testing system includes the ability to automatically fit standard and

user masks to data acquired into a waveform database. The mask test

system can also automatically determine the mask margin based either on

the total number of mask violations or the "hit ratio" of mask violation to the

number of samples acquired in the mask test unit interval. Users can also

create custom masks for automated mask testing. Histograms and cursor

measurements are also available to analyze optical signals acquired by the

DSA8300.

Test solutions

The DSA8300, with its highly configurable mainframe and a wide variety of

modules, provide complete test solutions with superior system fidelity.

Optical modules

The Tektronix 80C00 family of optical sampling modules cover a range

of wavelengths for both single- and multi-mode fibers. The various

modules provide a range of features such as clock recovery, reference

receiver filters, and a wide range of standards test solutions.

Refer to the Ordering information section for a list of currently available

optical modules.

Refer to the 80C00 Optical Modules datasheet for detailed descriptions

of each available module.

Electrical modules

The Tektronix 80E00 family of electrical sampling modules provide a

wide variety of capabilities, allowing the user to configure a test solution

specifically adapted to their application. A wide variety of bandwidth

solutions is available along with other features such as Time Domain

Reflectometry or S-parameter testing.

Refer to the Ordering information section for a list of currently available

electrical modules.

Refer to the 80E00 Electrical Sampling Modules datasheet for detailed

descriptions of each available module.

DSA8300 Digital Serial Analyzer Sampling Oscilloscope

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