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LTC4282 Datasheet(PDF) 28 Page - Analog Devices |
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LTC4282 Datasheet(HTML) 28 Page - Analog Devices |
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28 / 82 page ![]() LTC4284 28 Rev. B For more information www.analog.com APPLICATIONS INFORMATION After the internal power good signal is latched (see Power Good Monitors and PGI Fault), the LTC4284 goes into normal operation and the foldback is determined by the attenuated output voltage for the load, RTNS – DRNS (Figure 8b). If the output voltage or RTNS – DRNS drops to 0V in an event such as a catastrophic output short, the current limit sense voltage is folded back to the ratio con- figured by the FB bits. As shown in Figure 8b, the foldback ratio increases linearly with RTNS – DRNS and reaches 100% when RTNS – DRNS reaches 0.9V, which corre- sponds to the minimum supply voltage of an application. Above 0.9V the current limit sense voltage stays constant unless the load power foldback (LPFB) bit in the CONFIG_1 register 0x0D is set. If the LPFB bit is set, the current Figure 8a. Current Limit Foldback During Startup Figure 8b. Current Limit Foldback in Normal Operation limit sense voltage decreases linearly to 50% when RTNS – DRNS reaches 1.8V (corresponding to the maximum supply voltage). This profile approximately tracks the load power when the output voltage increases with a constant power load. The LTC4284 foldback profile can differentiate an output short fault from an allowed input step. Upon an output short, RTNS – DRNS drops and current limit is folded back to protect the MOSFETs from overstress. In the event of an input step, RTNS – DRNS increases while the load is charged up. The current limit either stays constant or approximates constant load power (based on the LPFB bit) to approach the optimum output ramp and minimize the temperature rise of the MOSFETs (see Input Step and Optimum Output Ramp). This is superior to a foldback profile capacitance based upon VDS or power dissipation of the MOSFET. In that case, the output short and input step conditions cannot be differentiated, often resulting in unwanted turn-off upon an input step. Foldback in normal operation can be independently dis- abled by setting the FB_DIS bit in the CONFIG_1 register 0x0D. With this configuration foldback is only effective during startup, and it should only be used when an RC network representing the thermal model of the MOSFET is connected to TMR. If a single capacitor is used, it is recommended to enable foldback in normal operation by clearing the FB_DIS bit for more conservative protection of the MOSFET. Note that the load power foldback con- trolled by the LPFB bit is not affected by the FB_DIS bit. FET Bad Fault and Auto-Retry In a hot swap application several possible faults can prevent the MOSFETs from turning on fully. A damaged MOSFET may have leakage from gate to drain or have degraded RDS(ON). Debris on the board may also pro- duce leakage or a short from the GATE pins to VEE or the MOSFET drain. In these conditions the LTC4284 may not be able to pull the GATE pins high enough to fully enhance the MOSFETs, or the MOSFETs may not reach the intended RDS(ON) when the GATE pins are fully enhanced. This can put the MOSFETs in a condition where the power in the MOSFETs is higher than its continuous power capability, even though the current is below the current limit. The VRTNS – VDRNS (V) VRTNS = 1.8V 0 100 50 20 10 0 0.9 4284 F08a 1.8 FB = 11 FB = 10 FB = 01 FB = 00 VRTNS – VDRNS (V) 0 100 50 20 10 0 0.9 4284 F08b 1.8 11 10 01 LPFB = 0 LPFB = 1 FB = 00 VRTNS = 1.8V |
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