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BLF989 Datasheet(PDF) 7 Page - Ampleon Netherlands B.V. |
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BLF989 Datasheet(HTML) 7 Page - Ampleon Netherlands B.V. |
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7 / 13 page ![]() BLF989_BLF989S All information provided in this document is subject to legal disclaimers. © Ampleon Netherlands B.V. 2019. All rights reserved. Product data sheet Rev. 3 — 24 May 2019 7 of 13 BLF989; BLF989S UHF power LDMOS transistor 7.3.4 Reliability TTF (0.1 % failure fraction). The reliability at pulsed conditions can be calculated as follows: TTF (0.1 %) 1 / . (1) Tj = 100 C (2) Tj =110 C (3) Tj = 120 C (4) Tj = 130 C (5) Tj = 140 C (6) Tj = 150 C (7) Tj = 160 C (8) Tj = 170 C (9) Tj = 180 C (10) Tj = 190 C (11) Tj = 200 C Fig 7. BLF989: BLF989S electromigration (IDS(DC), total device) amp00969 0 5 10 15 20 25 30 10-1 10 103 105 IDS(DC) (A) Years Years Years (1) (1) (1) (2) (2) (2) (3) (3) (3) (4) (4) (4) (5) (5) (5) (6) (6) (6) (7) (7) (7) (8) (8) (8) (9) (9) (9) (10) (10) (10) (11) (11) (11) |
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