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P1012AP13 Datasheet(PDF) 10 Page - ON Semiconductor |
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P1012AP13 Datasheet(HTML) 10 Page - ON Semiconductor |
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10 / 25 page ![]() NCP1010, NCP1011, NCP1012, NCP1013, NCP1014 www.onsemi.com 10 Figure 18. NCP101X Facing a Fault Condition (Vin = 150 Vdc) Tstart Tsw TLatch 1 V Ripple Latch−off Level The rising slope from the latch−off level up to 8.5 V is expressed by: Tstart + DV1 · C IC1 . The time during which the IC actually pulses is given by tsw + DV2 · C ICC1 . Finally, the latch−off time can be derived using the same formula topology: TLatch + DV3 · C ICC2 . From these three definitions, the burst duty−cycle can be computed: dc + Tsw Tstart ) Tsw ) TLatch (eq. 2) . dc + DV2 ICC1 · D V2 ICC1 ) DV1 IC1 ) DV3 ICC2 (eq. 3) . Feeding the equation with values extracted from the parameter section gives a typical duty−cycle of 13%, precluding any lethal thermal runaway while in a fault condition. DSS Internal Dissipation The Dynamic Self−Supplied pulls energy out from the drain pin. In Flyback−based converters, this drain level can easily go above 600 V peak and thus increase the stress on the DSS startup source. However, the drain voltage evolves with time and its period is small compared to that of the DSS. As a result, the averaged dissipation, excluding capacitive losses, can be derived by: PDSS + ICC1 · t Vds(t) u . (eq. 4) . Figure 19 portrays a typical drain−ground waveshape where leakage effects have been removed. Figure 19. A typical drain−ground waveshape where leakage effects are not accounted for. Vds(t) Vin Vr toff dt ton t Tsw By looking at Figure 19, the average result can easily be derived by additive square area calculation: t Vds(t) u+ Vin · (1 * d) ) Vr · toff Tsw (eq. 5) By developing Equation 5, we obtain: t Vds(t) u+ Vin * Vin · ton Tsw ) Vr · toff Tsw (eq. 6) toff can be expressed by: toff + Ip · Lp Vr (eq. 7) where ton can be evaluated by: ton + Ip · Lp Vin (eq. 8) . |
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