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LMV112 Datasheet(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part # LMV112
Description  40 MHz Dual Clock Buffer
PDF  14 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LMV112 Datasheet(HTML) 4 Page - National Semiconductor (TI)

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5V Electrical Characteristics (Continued)
Unless otherwise specified, all limits are guaranteed for T
J = 25˚C, VDD = 5V, VSS = 0V, VCM = 1V, Enable1,2 =VDD,CL =20
pF, R
L =30k
Ω,C
COUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (Note 4)
Symbol
Parameter
Conditions
Min
(Note 6)
Typ
(Note 5)
Max
(Note 6)
Units
Miscellaneous Performance
R
IN
Input Resistance per Buffer
Enable = V
DD
134
k
Ω
Enable = V
SS
134
C
IN
Input Capacitance per Buffer
Enable = V
DD
2.0
pF
Enable = V
SS
2.0
Z
IN
Input Impedance
f = 26 MHz, Enable = V
DD
7.2
k
Ω
f = 26 MHz, Enable = V
SS
8.0
V
O
Output Swing Positive
V
IN =VDD
4.96
4.94
4.99
V
Output Swing Negative
V
IN =VSS
10
40
55
mV
I
SC
Output Short-Circuit Current
(Note 9)
Sourcing
-40
-28
-68
mA
Sinking
70
50
98
V
en_hmin
Enable High Active Minimum
Voltage
1.2
V
V
en_lmax
Enable Low Inactive Maximum
Voltage
0.6
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables.
Note 2: Human Body Model: 1.5 k
Ω in series with 100 pF. Machine Model: 0Ω in series with 200 pF.
Note 3: The maximum power dissipation is a function of TJ(MAX), θJA , and TA. The maximum allowable power dissipation at any ambient temperature is
PD =(TJ(MAX) −TA)/ θJA. All numbers apply for packages soldered directly onto a PC board.
Note 4: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of
the device such that TJ =TA . There is no guarantee of parametric performance as indicated in the electrical tables under conditions of internal self-heating where
TJ > TA.
Note 5: Typical Values represent the most likely parametric norm.
Note 6: All limits are guaranteed by testing or statistical analysis.
Note 7: Slew rate is the average of the positive and negative slew rate.
Note 8: Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total temperature change.
Note 9: Short−Circuit test is a momentary test. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed
junction temperature of 150˚C.
www.national.com
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