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LMV112 Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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LMV112 Datasheet(HTML) 4 Page - National Semiconductor (TI) |
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4 / 14 page ![]() 5V Electrical Characteristics (Continued) Unless otherwise specified, all limits are guaranteed for T J = 25˚C, VDD = 5V, VSS = 0V, VCM = 1V, Enable1,2 =VDD,CL =20 pF, R L =30k Ω,C COUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See (Note 4) Symbol Parameter Conditions Min (Note 6) Typ (Note 5) Max (Note 6) Units Miscellaneous Performance R IN Input Resistance per Buffer Enable = V DD 134 k Ω Enable = V SS 134 C IN Input Capacitance per Buffer Enable = V DD 2.0 pF Enable = V SS 2.0 Z IN Input Impedance f = 26 MHz, Enable = V DD 7.2 k Ω f = 26 MHz, Enable = V SS 8.0 V O Output Swing Positive V IN =VDD 4.96 4.94 4.99 V Output Swing Negative V IN =VSS 10 40 55 mV I SC Output Short-Circuit Current (Note 9) Sourcing -40 -28 -68 mA Sinking 70 50 98 V en_hmin Enable High Active Minimum Voltage 1.2 V V en_lmax Enable Low Inactive Maximum Voltage 0.6 Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables. Note 2: Human Body Model: 1.5 k Ω in series with 100 pF. Machine Model: 0Ω in series with 200 pF. Note 3: The maximum power dissipation is a function of TJ(MAX), θJA , and TA. The maximum allowable power dissipation at any ambient temperature is PD =(TJ(MAX) −TA)/ θJA. All numbers apply for packages soldered directly onto a PC board. Note 4: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ =TA . There is no guarantee of parametric performance as indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Note 5: Typical Values represent the most likely parametric norm. Note 6: All limits are guaranteed by testing or statistical analysis. Note 7: Slew rate is the average of the positive and negative slew rate. Note 8: Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total temperature change. Note 9: Short−Circuit test is a momentary test. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature of 150˚C. www.national.com 4 |
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