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SE555CD Datasheet(PDF) 6 Page - Texas Instruments

Part # SE555CD
Description  PRECISION TIMERS SE555C FROM TI IS NOT RECOMMENDED FOR NEW DESIGNS
PDF  15 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SE555CD Datasheet(HTML) 6 Page - Texas Instruments

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THRES voltage level
TRIG voltage level
RESET current
CONT voltage (open circuit)
Low-level output voltage
Supply current
VCC = 15 V
VCC = 5 V
VCC = 15 V
Output low,
No load
Output high,
No load
V
V
mA
V
V
V
Initial error of timing interval†
%/V
ns
CL = 15 pF
Supply voltage sensitivity of timing interval
SLFS022 – D1669, SEPTEMBER 1973—REVISED FEBRUARY 1992
NE555Y
PRECISION TIMERS
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
6
electrical characteristics, VCC = 5 V to 15 V, TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VCC = 15 V
8.8
10
11.2
VCC = 5 V
2.4
3.3
4.2
THRES current (see Note 2)
30
250
nA
VCC = 15 V
4.5
5
5.6
VCC = 5 V
1.1
1.67
2.2
TRIG current
TRIG at 0 V
0.5
2
µA
RESET voltage level
0.3
0.7
1
V
RESET at VCC
0.1
0.4
RESET at 0 V
– 0.4
– 1.5
DISCH switch off-state current
20
100
nA
VCC = 15 V
9
10
11
VCC = 5 V
2.6
3.3
4
IOL = 10 mA
0.1
0.25
IOL = 50 mA
0.4
0.75
IOL = 100 mA
2
2.5
IOL = 200 mA
2.5
IOL = 5 mA
0.1
0.35
IOL = 8 mA
0.15
0.4
IOH = – 100 mA
12.75
13.3
High-level output voltage
IOH = – 200 mA
12.5
VCC = 5 V
IOH = – 100 mA
2.75
3.3
VCC = 15 V
10
15
VCC = 5 V
3
6
mA
VCC = 15 V
9
13
VCC = 5 V
2
5
NOTE 2: This parameter influences the maximum value of the timing resistors RA and RB in the circuit of Figure 12. For example, when
VCC = 5 V, the maximum value is R = RA + RB ≈ 3.4 MΩ, and for VCC = 15 V, the maximum value is 10 MΩ
operating characteristics, VCC = 5 V and 15 V, TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Each timer, monostable‡
1%
3%
Each timer, astable§
2.25%
Each timer, monostable‡
0.1
0.5
Each timer, astable§
0.3
Output pulse rise time
100
300
Output pulse fall time
100
300
† Timing interval error is defined as the difference between the measured value and the average value of a random sample from each process run.
‡ Values specified are for a device in a monostable circuit similar to Figure 9, with component values as follow: RA = 2 kΩ to 100 kΩ, C = 0.1 µF.
§ Values specified are for a device in an astable circuit similar to Figure 12, with component values as follow: RA = 1 kΩ to 100 kΩ, C = 0.1 µF.



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