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L9678P Datasheet(PDF) 127 Page - STMicroelectronics

Part # L9678P
Description  Automotive user configurable airbag and battery cut-off IC
PDF  215 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9678P Datasheet(HTML) 127 Page - STMicroelectronics

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DS11626 Rev 9
127/216
L9678P, L9678P-S
Deployment drivers
214
Figure 28. High level loop diagnostic flow 1
GAPGPS01643
Low level diagnostic is selected (bit 15
of LPDIAGREQ is low) OR an invalid
high level diagnostic is selected OR we
are in DEP_ENABLED state
Leakage test time elapsed
Leakage test time elapsed
SBL flag is asserted if STG
is no more present
AND (FET test is selected)
AND NO leakage is present
Leakage test time elapsed
AND ((LEAKAGE test) OR
(SBL and no leakage is
present) OR (FET test and
leakage is present))
Latch STB, STG flags
FP = 1 if FET test is selected
VRCM (check time elapsed
AND ((VRCM, CHECK test)
is selected OR VRCM fails)
Latch STB, STG flags
FP = 1 if LEAKAGE or
FET T tests are selected
Leakage test time elapsed
AND (SBL is selected)
AND leakage is present
TIP = 1
Enable VRCM
Disable ISRC and
ISINK
Disable ALL pull
down currents
TIP = 1
TIP = 0
Enable VRCM
Disable ISRC and ISINK
TIP = 1
Enable VRCM
Disable ISRC and ISINK
TIP = 1
Enable VRCM
Disable ISRC and ISINK
Enable HS or LS FET if also
DSTEST = 0111 or 1000
TIP = 1
Off time elapsed AND new
diagnostic request is
VRCM_CHECK OR
LEAKAGE OR SBL OR
FET tests
Off time = 24μs
New high level diagnostic request
(bit 15 of LPDIAGREQ is high)
Wait enaugh time to
be sure that all
currents and voltages
supplies start in OFF state
FET test timeout = 200μs
Leakage test time = 152/600μs
Leakage test time = 152/600μs
FET TEST
DIAG_OFF
WAIT_OFF
LEAKAGE_TEST_1
LEAKAGE_TEST_2
VRCM check time = 40μs/160μs
VRCM_CHECK
Leakage is detected (due to
the fact that FETs work
properly) OR FET test
timeout elapsed



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