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AD5683R Datasheet(PDF) 8 Page - Analog Devices |
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AD5683R Datasheet(HTML) 8 Page - Analog Devices |
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8 / 12 page ![]() CN-0411 Circuit Note Rev. 0 | Page 8 of 12 Auto-Ranging Conductivity Measurement For a given type of solution and conductivity probe used, the range of conductivity measurement range encompasses multiple gain resistance settings. Furthermore, to prevent the excitation voltage from exceeding the rated voltage of the conductivity cell, the excitation voltage value must change along with the gain resistance. The software is capable of automatically setting the gain resistance and the excitation voltage to the range of the conductivity of the solution. This ensures that the conductivity reading is always being measured at the most reliable setting. The method of auto-ranging the conductivity measurement is described in Figure 12. Figure 12. Auto-Ranging Conductivity Measurement Flowchart Calibration Procedure The system is capable of two calibration methods, a zero-scale calibration and through a reference precision resistance. The calibration method used to obtain the measurements discussed in Figure 15 uses a reference precision resistance, which can either be a 20 Ω or 200 Ω resistor as shown in Figure 5. It is in these resistance ranges that the on-resistance of the multiplexer has a significant effect on the conductivity measurement. The output of this calibration is an offset resistance value, which is added to the gain resistance used in the computation of conductivity. Figure 13 shows the procedure to perform this calibration. Figure 13. Flowchart of Calibration Procedure through a Reference Resistance The zero-scale calibration performs the zero-scale calibration of the AD7124-8, which eliminates the output bias voltages of the sample-and-hold topology. This ensures that a zero-input to the conductivity cell corresponds to the ADCs zero code. Place a shunt in Pin 2 and Pin 3 of Jumper Header P6 of the CN-0411 board. The AD7124-8 is commanded to perform system zero- scale calibration on both the positive and negative voltages of the conductivity signal. This stores the zero-input voltage level in the ADCs offset registers and is automatically considered in every sample reading. Both these two calibration methods need to be done only once for each board since the software stores the output of the calibration procedures. System Accuracy From Equation 9, the computation of conductivity depends on the two output voltages of the sample-and-hold topology, RGAIN, and the DAC output voltage. RGAIN resistors below the MΩ range have 0.1% tolerance while the 2 MΩ and 20 MΩ resistors have 1% tolerance. Added to the resistances in the simple voltage divider network shown in Figure 3 are the on- resistances of the multiplexer ADG1608 and the conductivity cell switch ADG884, which are maximum at 17.4 Ω and 0.96 Ω, respectively. The input bias currents and input offset current from the instrumentation amplifier introduces a voltage, which scales with the gain resistance and the resistance of the solution. The B-grade AD8220 has a max input bias current of 10 pA for each input and a max input offset current of 0.6 pA, which makes a total input bias current of 20.6 pA. At 20 MΩ, this constitutes a 20.6 pA × 20 MΩ = 412 µV input bias voltage. Moreover, at a gain of 10, the AD8220 has a 0.2% max gain error. Computing conductivity directly from a known precision resistance measures the system accuracy and accounts for all these factors, including the ones introduced by the sample-and- hold topology, such as the drop voltage in Equation 4. START SET MULTIPLEXER TO HIGHEST GAIN RESISTANCE (20MΩ) READ ADC INPUT V+ AND V– YES NO PERFORM CONDUCTIVITY MEASUREMENT AND TEMPERATURE MEASUREMENT CALCULATE TDS DROP GAIN RESISTANCE BY 1 DECADE V+ + V– > 0.3 × 2VEXC SET DAC TO OUTPUT VEXC = 400mV (OR SPECIFIED USER DAC VOLTAGE VDAC) SET VEXC = VDEF × VEXC V+ + V– START SHORT TERMINALS 3 AND 4, OR 5 AND 6, IN JUMPER P5 PERFORM ADC SAMPLING AND COMPUTE V+ AND V– FROM THE INPUT POSITIVE AND NEGATIVE VOLTAGES COMPUTE OFFSET RESISTANCE ROFFSET = WHERE: RREF IS THE REFERENCE PRECISION RESISTOR TOLERANCE VEXC IS THE CURRENT EXCITATION VOLTAGE VALUE V+ IS THE POSITIVE SAMPLE-AND-HOLD OUTPUT VOLTAGE V– IS THE NEGATIVE SAMPLE-AND-HOLD OUTPUT VOLTAGE – RGAIN RFEF (2(VEXC) – 2(V+ + V–)) 2(V+ + V–)) END |
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