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LTC3446 Datasheet(PDF) 4 Page - Linear Technology

Part # LTC3446
Description  Monolithic Buck Regulator with Dual VLDO Regulators
PDF  20 Pages
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Manufacturer  LINER [Linear Technology]
Direct Link  http://www.linear.com
Logo LINER - Linear Technology

LTC3446 Datasheet(HTML) 4 Page - Linear Technology

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LTC3446
4
3446fd
ELECTRICAL CHARACTERISTICS
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: The LTC3446E is guaranteed to meet performance specifications
from 0°C to 85°C. Specifications over the – 40°C to 85°C operating
temperature range are assured by design, characterization and correlation
with statistical process controls. The LTC3446I is guaranteed to
meet performance specifications over the –40°C to 125°C operating
temperature range.
Note 3: Minimum operating VIN voltage required for the VLDO regulators
to stay in regulation is:
VIN ≥ LVOUT(MAX) + 1.4V and VIN ≥ 2.7V
Note 4: Dynamic supply current is higher due to the internal gate charge
being delivered at the switching frequency.
Note 5: The LTC3446 is tested in a feedback loop that connects the
BUCKFB pin to the output of the buck converter’s error amplifier (i.e., the
ITH pin).
Note 6: Minimum operating LVIN voltage required for the VLDO regulators
to stay in regulation is:
LVIN ≥ LVOUT(MAX) + 100mV and LVIN ≥ 0.9V
Note 7: Operating conditions are limited by maximum junction
temperature. The regulated output voltage specification will not apply
for all possible combinations of input voltage and output current. When
operating at maximum input voltage, the output current range must be
limited. When operating at maximum output current, the input voltage
range must be limited.
Note 8: PGOOD assertion indicates that the feedback voltages of all
enabled supplies are within the specified percentage of their target values.
Note 9: Dropout voltage in the DFN package is assured by design,
characterization and statistical process control.



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