TPS2811, TPS2812, TPS2813, TPS2814, TPS2815

DUAL HIGH-SPEED MOSFET DRIVERS

SLVS132D – NOVEMBER 1995 – REVISED NOVEMBER 1997

15

POST OFFICE BOX 655303

APPLICATION INFORMATION

matching and paralleling connections

Figures 21 and 22 show the delays for the rise and fall time of each channel. As can be seen on a 5-ns scale,

there is very little difference between the two channels at no load. Figures 23 and 24 show the difference

between the two channels for a 1-nF load on each output. There is a slight delay on the rising edge, but little

or no delay on the falling edge. As an example of extreme overload, Figures 25 and 26 show the difference

between the two channels, or two drivers in the package, each driving a 10-nF load. As would be expected, the

rise and fall times are significantly slowed down. Figures 28 and 29 show the effect of paralleling the two

channels and driving a 1-nF load. A noticeable improvement is evident in the rise and fall times of the output

waveforms. Finally, Figures 30 and 31 show the two drivers being paralleled to drive the 10-nF load and as could

be expected the waveforms are improved. In summary, the paralleling of the two drivers in a package enhances

the capability of the drivers to handle a larger load. Because of manufacturing tolerances, it is not recommended

to parallel drivers that are not in the same package.

Regulator

50

Ω

1

2

3

4

8

7

6

5

1 nF

Output

0.1

µF

4.7

µF

+

VCC

TPS2811

Figure 19. Test Circuit for Measuring Switching Characteristics

Regulator

50

Ω

1

2

3

4

8

7

6

5

CL(2)

CL(1)

Output 1

0.1

µF

4.7

µF

+

VCC

TPS2811

NOTE A: Input rise and fall times should be

≤10 ns for accurate measurement of ac parameters.

Output 2

Figure 20. Test Circuit for Measuring Switching Characteristics with the Inputs Connected in Parallel