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SE95DP Datasheet(PDF) 6 Page - NXP Semiconductors |
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SE95DP Datasheet(HTML) 6 Page - NXP Semiconductors |
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6 / 27 page ![]() SE95_7 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 07 — 2 September 2009 6 of 27 NXP Semiconductors SE95 Ultra high accuracy digital temperature sensor and thermal watchdog 7.2 OS output and polarity The OS output is an open-drain output and its state represents results of the device watchdog operation as described in Section 7.1. In order to observe this output state, an external pull-up resistor is needed. The resistor should be as large as possible, up to 200 k Ω, to minimize the Temp reading error due to internal heating by the high OS sinking current. The OS output active state can be selected as HIGH or LOW by programming bit OS_POL of register Conf: setting bit OS_POL to logic 1 selects OS active HIGH and setting to logic 0 sets OS active LOW. At power-up, bit OS_POL is equal to logic 0 and the OS active state is LOW. 7.3 OS comparator and interrupt modes As described in Section 7.1, the OS output responds to the result of the comparison between register Temp data and the programmed limits, in registers Tos and Thyst, in different ways depending on the selected OS mode: OS comparator or OS interrupt. The OS mode is selected by programming bit OS_COMP_INT of register Conf: setting bit OS_COMP_INT to logic 1 selects the OS interrupt mode, and setting to logic 0 selects the OS comparator mode. At power-up, bit OS_COMP_INT is equal to logic 0 and the OS comparator is selected. The main difference between the two modes is that in OS comparator mode, the OS output becomes active when Temp has exceeded Tos and reset when Temp has dropped below Thyst, reading a register or putting the device into shutdown mode does not change the state of the OS output; while in OS interrupt mode, once it has been activated either by exceeding Tos or dropping below Thyst, the OS output will remain active indefinitely until reading a register or putting the device into shutdown mode occurs, then the OS output is reset. Temperature limits Tos and Thyst must be selected so that Tos > Thyst. Otherwise, the OS output state will be undefined. 7.4 OS fault queue Fault queue is defined as the number of faults that must occur consecutively to activate the OS output. It is provided to avoid false tripping due to noise. Because faults are determined at the end of data conversions, fault queue is also defined as the number of consecutive conversions returning a temperature trip. The value of fault queue is selectable by programming the two bits OS_F_QUE[1:0] in register Conf. Notice that the programmed data and the fault queue value are not the same. Table 3 shows the one-to-one relationship between them. At power-up, fault queue data = 00 and fault queue value = 1. Table 3. Fault queue table Fault queue data Fault queue value OS_F_QUE[1] OS_F_QUE[0] Decimal 001 012 104 116 |
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