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ATmega324P Datasheet(PDF) 264 Page - ATMEL Corporation |
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ATmega324P Datasheet(HTML) 264 Page - ATMEL Corporation |
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264 / 377 page ![]() 264 7674F–AVR–09/09 ATmega164P/324P/644P 22.3 TAP – Test Access Port The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins constitute the Test Access Port – TAP. These pins are: • TMS: Test mode select. This pin is used for navigating through the TAP-controller state machine. • TCK: Test Clock. JTAG operation is synchronous to TCK. • TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data Register (Scan Chains). • TDO: Test Data Out. Serial output data from Instruction Register or Data Register. The IEEE std. 1149.1 also specifies an optional TAP signal; TRST – Test ReSeT – which is not provided. When the JTAGEN Fuse is unprogrammed, these four TAP pins are normal port pins, and the TAP controller is in reset. When programmed, the input TAP signals are internally pulled high and the JTAG is enabled for Boundary-scan and programming. The device is shipped with this fuse programmed. For the On-chip Debug system, in addition to the JTAG interface pins, the RESET pin is moni- tored by the debugger to be able to detect external reset sources. The debugger can also pull the RESET pin low to reset the whole system, assuming only open collectors on the reset line are used in the application. Figure 22-1. Block Diagram TAP CONTROLLER TDI TDO TCK TMS FLASH MEMORY AVR CPU DIGITAL PERIPHERAL UNITS JTAG / AVR CORE COMMUNICATION INTERFACE BREAKPOINT UNIT FLOW CONTROL UNIT OCD STATUS AND CONTROL INTERNAL SCAN CHAIN M U X INSTRUCTION REGISTER ID REGISTER BYPASS REGISTER JTAG PROGRAMMING INTERFACE PC Instruction Address Data BREAKPOINT SCAN CHAIN ADDRESS DECODER ANALOG PERIPHERIAL UNITS I/O PORT 0 I/O PORT n BOUNDARY SCAN CHAIN Analog inputs Control & Clock lines DEVICE BOUNDARY |
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