ATmega324P datasheet(272/377 Pages) ATMEL

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7674F–AVR–09/09

ATmega164P/324P/644P

23.4.2

IDCODE; 0x1

Optional JTAG instruction selecting the 32 bit ID-Register as Data Register. The ID-Register

consists of a version number, a device number and the manufacturer code chosen by JEDEC.

This is the default instruction after power-up.

The active states are:

• Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan Chain.

• Shift-DR: The IDCODE scan chain is shifted by the TCK input.

23.4.3

SAMPLE_PRELOAD; 0x2

Mandatory JTAG instruction for pre-loading the output latches and taking a snap-shot of the

input/output pins without affecting the system operation. However, the output latches are not

connected to the pins. The Boundary-scan Chain is selected as Data Register.

The active states are:

• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.

• Shift-DR: The Boundary-scan Chain is shifted by the TCK input.

• Update-DR: Data from the Boundary-scan chain is applied to the output latches. However, the

output latches are not connected to the pins.

23.4.4

AVR_RESET; 0xC

The AVR specific public JTAG instruction for forcing the AVR device into the Reset mode or

releasing the JTAG reset source. The TAP controller is not reset by this instruction. The one bit

Reset Register is selected as Data Register. Note that the reset will be active as long as there is

a logic “one” in the Reset Chain. The output from this chain is not latched.

The active states are:

• Shift-DR: The Reset Register is shifted by the TCK input.

23.4.5

BYPASS; 0xF

Mandatory JTAG instruction selecting the Bypass Register for Data Register.

The active states are:

• Capture-DR: Loads a logic “0” into the Bypass Register.

• Shift-DR: The Bypass Register cell between TDI and TDO is shifted.

23.5

Boundary-scan Chain

The Boundary-scan chain has the capability of driving and observing the logic levels on the digi-

tal I/O pins, as well as the boundary between digital and analog logic for analog circuitry having

off-chip connection.

23.5.1

Scanning the Digital Port Pins

Figure 23-3 shows the Boundary-scan Cell for a bi-directional port pin. The pull-up function is

disabled during Boundary-scan when the JTAG IC contains EXTEST or SAMPLE_PRELOAD.

The cell consists of a bi-directional pin cell that combines the three signals Output Control -

OCxn, Output Data - ODxn, and Input Data - IDxn, into only a two-stage Shift Register. The port

and pin indexes are not used in the following description

ATmega324P Datasheet(PDF) 272 Page - ATMEL Corporation

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