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LTC6801 Datasheet(PDF) 13 Page - Linear Technology |
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LTC6801 Datasheet(HTML) 13 Page - Linear Technology |
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13 / 28 page ![]() LTC6801 13 6801p APPLICATIONS INFORMATION ENABLE INPUTS In order to support stacked operation, the LTC6801 is enabled through a differential signal chain encompassing the EIN/EIN, EOUT/EOUT, and SIN/SIN pins. The LTC6801 will be enabled if a differential square wave with a frequency between 2kHz and 50kHz is applied at EIN/EIN. Otherwise, the LTC6801 will default to a low power idle mode. If the differential signal at SIN/SIN is not equal in frequency to the differential signal output at EOUT/EOUT, the LTC6801 will be enabled but SOUT will be held at 0V and SOUT will be held at VREG. For the simplest operation in a single chip configuration, EOUT should be connected directly to SIN and EOUT should be connected directly to SIN, and a square wave with a frequency between 2kHz and 50kHz should be applied differentially to EIN and EIN. For enable clock frequencies up to 10kHz, a single-ended square wave with a 5V swing may be used at EIN while a 1nF capacitor is connected from EIN to V–. STATUS OUTPUT If the chip is properly enabled (EIN/EIN, SIN/SIN are the same frequency), all cells are within the undervoltage and overvoltage thresholds, and the voltage at VTEMP1 and VTEMP2 is over one half VREF, the differential output at SOUT/SOUT will toggle at the same frequency and in phase with the signal at EIN/EIN. Otherwise, SOUT will be low and SOUT will be high. The maximum delay between when a bad cell voltage occurs and when it is detected depends on the measure- ment duty cycle setting. The SOUT clock turns on or off at the end of each measurement cycle. Figure 4 shows the maximum detection delay in continuous monitor mode (DC pin tied to VREG). FAULT PROTECTION Overview Care should always be taken when using high energy sources such as batteries. There are countless ways that systems can be [mis-]configured during the assembly and service procedures that can impact a battery’s long term performance. Table 6 shows various situations to consider when planning protection circuitry. Battery Interconnection Integrity Please note: The last condition shown in the FMEA table could cause catastrophic IC failures. In this case, the battery string integrity is lost within a cell group monitored by an LTC6801. This condition could place excessive stress on certain cell input signal clamp-diodes and probably lead to IC failure. If this scenario seems at all likely in a particular application, Schottky diodes should be added in parallel with the cells as shown in Figure 5 to form a redundant load current path and a means of limiting stress on the IC inputs. The diodes used in this situation need current ratings sufficient to open a protective fuse in the battery tap signal (otherwise they would have to carry the normal range of cell currents). |
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