LSM320HAY30

Mechanical and electrical specifications

Doc ID 16917 Rev 1

11/42

2.2

Electrical characteristics

AR_ST

Angular rate self-test output

change

250

mV

Top

Operating temperature range

-40

+85

°C

1.

Linear acceleration (LA), Angular Rate (AR) parameter labeling

2.

Typical specifications are not guaranteed

3.

Verified by wafer level test and measurement of initial offset and sensitivity

4.

Sensitivity and zero-rate offset are not ratiometric to supply voltage

5.

Typical zero-

g level offset value after MSL3 preconditioning

6.

Offset can be eliminated by enabling the built-in high-pass filter

7.

Refer to

Table 23 for filter cut-off frequency.

8.

The product is capable of measuring angular rates extending from DC to the selected BW.

9.

The sign of “Self-test output change” is defined by LA_CTRL_REG4 STsign bit (

Table 27), for all axes.

10. Linear acceleration sensing Self-Test output changes with the power supply. “Self-test output change” is defined as

Full-scale

11. Output data reach 99% of final value after 1/ODR+1ms when enabling linear acceleration sensing self-test mode, due to

device filtering.

Table 2.

Mechanical characteristics (continued)

Parameter

Test conditions

Min.

Max.

Unit

b.

The product is factory calibrated at 3 V.

Table 3.

Electrical characteristics

Symbol

Parameter

Test condition

Min.

Max.

Unit

Vdd

Supply voltage

2.7

3.0

3.6

V

Vdd_IO

1.71

Vdd+0.1

V

LA_Idd

Linear acceleration current

consumption in normal mode

ODR = 50 Hz

0.25

mA

AR_Idd

Angular rate current consumption

in normal mode

ARPD pin

connected to GND

6.8

mA

LA_IddLP

Linear acceleration current

consumption in low-power mode

10

µA

AR_IddSl

Angular rate current consumption

in sleep mode

ARPD, ARST pin

connected to Vdd

2.1

5

mA

LA_IddPdn

Linear acceleration current

consumption in power-down mode

1µA

AR_IddPdn

Angular rate current consumption

in power-down mode

ARPD pin

connected to Vdd

15

µA