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PCIMX536AVV8B Datasheet(PDF) 46 Page - Freescale Semiconductor, Inc |
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PCIMX536AVV8B Datasheet(HTML) 46 Page - Freescale Semiconductor, Inc |
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46 / 180 page ![]() i.MX53xA Automotive and Infotainment Applications Processors, Rev. 1 46 Freescale Semiconductor Electrical Characteristics NOTE A potential limitation for minimum clock frequency may exist for some devices. When the clock frequency is too low, the data bus capturing might occur after the specified trhoh (RE_B high to output hold) period. Setting the clock frequency above 25.6 MHz (that is, T = 39 ns) guaranties a proper operation for devices having trhoh > 15 ns. It is also recommended that the NFC_FREQ_SEL Fuse be set accordingly to initiate the boot with 33.33 MHz clock. Lower frequency operation can be supported for most available devices in the market, relying on data lines Bus-Keeper logic. This depends on device behavior on the data bus in the time interval between data output valid to data output high-Z state. In NAND device parameters this period is marked between trhoh and trhz (RE_B high to output high-Z). In most devices, the data transition from valid value to high-Z occurs without going through other states. Setting the data bus pads to Bus-Keeper mode in the IOMUXC registers, keeps the data bus valid internally after the specified hold time, allowing proper capturing with slower clock. Figure 10. Command Latch Cycle Timing 133 4 33.33 30 3 44.333 22.5 2663 15 1 Boot value NFC_FREQ_SEL Fuse High (burned) 2 Boot value NFC_FREQ_SEL Fuse Low 3 For RBB_MODE=1, using NANDF_RB0 signal for ready/busy indication. This mode require setting the delay line. See the Reference Manual for details. Table 33. NFC Clock Settings Examples (continued) emi_slow_clk (MHz) nfc_podf (Division Factor) enfc_clk (MHz) T-Clock Period (ns) NFCLE NFCE_B NFWE_B NFIO[7:0] command NF9 NF8 NF1 NF2 NF5 NF3 NF4 |
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