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LC9997 Datasheet(PDF) 9 Page - Sanyo Semicon Device |
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LC9997 Datasheet(HTML) 9 Page - Sanyo Semicon Device |
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9 / 11 page ![]() No. 5783-9/11 LC9997M Image Defect Standards Test Conditions Defect position are classified on the monitor as shown below. Test temperature Test item Allowable defects Notes 55°C White defects At most 5 per zone 1 No white defects that cover 2 or more pixels in the horizontal direction or 2 or more lines in the vertical direction. Black defects At most 10 per zone 2 25°C No black defects that cover 2 or more pixels in the horizontal direction or 2 or more lines in the vertical direction. Molding debris No defects 3 is not tested. Notes 1. A white defect is a 10 mV or more higher than the CCD output optical black area for a black image. The CCD device is defective if any such level is 20 mV or more above the optical black level. 2. A black defect is a level that is 10% or more below the average level when the CCD is illuminated so that the average level is about 400 mV. 3. Using the Fujinon TV zoom lens H6 × 12.5R 1:1.2/12.5-75 stopped down to f 5.6 and with a 20% neutral density filter mounted, no dusts in the resin should be visible on the image screen. |
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