DDC264

SBAS368C

– MAY 2006 – REVISED JULY 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

DDC FAMILY OVERVIEW

MAXIMUM

PACKAGE-

PRODUCT

NO. OF CHANNELS

FULL-SCALE

DATA RATE

POWER/CHANNEL

LEAD

DDC112

2

1000pC

20kSPS

40mW

SO-28

DDC112K

2

1000pC

3.3kSPS

40mW

TQFP-32

DDC114

4

350pC

3.3kSPS

13mW

QFN-48

DDC118

8

350pC

3.3kSPS

13mW

QFN-48

DDC316

16

12pC

100kSPS

28mW

BGA-64

DDC232C

32

350pC

3.1kSPS

7mW

BGA-64

DDC232CK

32

350pC

6.2kSPS

10mW

BGA-64

DDC264C

64

150pC

3.1kSPS

3mW

BGA-100

DDC264CK

64

150pC

6.2kSPS

5.5mW

BGA-100

ORDERING INFORMATION

For the most current package and ordering information see the Package Option Addendum at the end of this

document, or visit the device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

AVDD to AGND

–0.3V to +6V

DVDD to DGND

–0.3V to +3.6V

AGND to DGND

±0.2V

VREF Input to AGND

2.0V to AVDD + 0.3V

Analog Input to AGND

–0.3V to +0.7V

Digital Input Voltage to DGND

–0.3V to DVDD + 0.3V

Digital Output Voltage to DGND

–0.3V to DVDD + 0.3V

Operating Temperature

0

°C to +70°C

Storage Temperature

–60°C to +150°C

+150

°C

Human Body Model (HBM)

4kV

JEDEC standard 22, test method A114-C.01, all pins

ESD

Ratings:

Charged Device Model (CDM)

1kV

JEDEC standard 22, test method A114-C.01, all pins

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

Copyright

© 2006–2011, Texas Instruments Incorporated