GC6016 datasheet(39/46 Pages) TI1

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CEB

Addr

OEB

WEB

Data

T0517-01

su(RD)

dly(RD)

h(RD)

oh(RD)

z(RD)

GC6016

www.ti.com

SLWS227A

– NOVEMBER 2010 – REVISED MARCH 2011

Table 26. MPU Switching Characteristics (READ)

PARAMETER

TEST CONDITIONS

MIN MAX

UNIT

tsu(RD)

CEB and ADDR setup time to

↓OEB

See(1)

1.5

tdly(RD)

Data valid time after

↓OEB

See(1)

th(RD)

CEB and ADDR hold time to

↑OEB

See(1)

2.5

tHIGH(RD)

Time OEB must remain HIGH between READs

See(1)

tz(RD)

Data goes to high-impedance state after

↑OEB or ↑CEB

See(2)

tcycle(RD)

Time between READs

See(1)

toh(RD)

Time after OEB

↑ that data is valid

See (2)

TBD

(1)

Chip specifications are production tested at 90

°C case temperature for the given specification. Early production lots are sample tested

–40°C.

(2)

Bench tested for output start changing after releasing strobe with a 50-

Ω load on the output

Figure 25. MPU READ Timing Specifications

Table 27. MPU Switching Characteristics (WRITE)

PARAMETER

TEST CONDITIONS

MIN MAX

UNIT

tsu(WR)

CEB, DATA, and ADDR setup time to

↓WEB

See(1)

1.4

th(WR)

CEB, DATA, and ADDR hold time after

↑WEB

See(1)

tlow(WR)

Time WEB and CEB must remain simultaneously LOW

See(1)

thigh(WR)

Time CEB or WRB must remain HIGH between WRITEs

See(1)

tcycle(WR)

Time between WRITEs

See(1)

(1)

Chip specifications are production tested at 90

°C case temperature for the given specification. Early production lots are sample tested

–40°C.

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