375

375

60

.

+

-

D

DE

Y

Z

W

W

W

V

CC2

0 or 3 V

GND2

V

OD

V

=

-7 V to 12 V

TEST

0 or

II

VI

D

DE

Y

Z

V

Z

V

Y

V

OD

I

Y

I

Z

GND2

GND1

V

CC1

V

CC1

GND2

GND1

R

L

VOC

Z

VZ

VY

Y

VOC(SS)

OC(p-p)

V

Generator: PRR= 100 kHz, 50 % duty

cycle, t r < 6ns, tf <6 ns, ZO = 50W

Input

Input

II

VI

D

DE

Y

Z

VOD

27

±1%

W

GND1

GND2

GND2

GND1

27

±1%

W

_

+

V

OS

DE

D

GND1

GND2

Y

Z

I

OS

I

OS

300

250

time

L

= 50pF

50

D

Y

Z

DE

VI

Input

Generator

± 20%

±1%

W

W

Generator: PRR = 100 kHz, 50 % duty cycle,

t r < 6ns, tf <6 ns, ZO = 50W

includes fixture and

instrumentation capacitance

C

L

C

GND1

50%

3 V

tf

tr

10%

90%

VI

90%

10 %

50%

50 %

50 %

ISO35T

SLLSE26C

– NOVEMBER 2010 – REVISED AUGUST 2011

www.ti.com

PARAMETER MEASUREMENT INFORMATION

Test Circuit

Figure 3. Test Circuit and Waveform Definitions For The Driver Common-Mode Output Voltage

Figure 4. Driver Short-Circuit Test Circuit and Waveforms (Short Circuit applied at Time t=0

Figure 5. Driver Switching Test Circuit and Voltage Waveforms

6

Copyright

© 2010–2011, Texas Instruments Incorporated