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PCAL9535APW Datasheet(PDF) 22 Page - NXP Semiconductors |
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PCAL9535APW Datasheet(HTML) 22 Page - NXP Semiconductors |
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22 / 46 page ![]() PCAL9535A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 1 — 28 September 2012 22 of 46 NXP Semiconductors PCAL9535A Low-voltage 16-bit I2C-bus I/O port with interrupt and Agile I/O Reducing the current drive capability may be desirable to reduce system noise. When the output switches (transitions from H/L), there is a peak current that is a function of the output drive selection. This peak current runs through VDD and VSS package inductance and will create noise (some radiated, but more critically Simultaneous Switching Noise (SSN)). In other words, switching many outputs at the same time will create ground and supply noise. The output drive strength control through the Current Control registers allows the user to mitigate SSN issues without the need of additional external components. 8.3 Power-on reset requirements In the event of a glitch or data corruption, PCAL9535A can be reset to its default conditions by using the power-on reset feature. Power-on reset requires that the device go through a power cycle to be completely reset. This reset also happens when the device is powered on for the first time in an application. The two types of power-on reset are shown in Figure 17 and Figure 18. Table 28 specifies the performance of the power-on reset feature for PCAL9535A for both types of power-on reset. Fig 17. VDD is lowered below 0.2 V or to 0 V and then ramped up to VDD Fig 18. VDD is lowered below the POR threshold, then ramped back up to VDD 002aah329 VDD time ramp-up ramp-down (dV/dt)r (dV/dt)f re-ramp-up (dV/dt)r time to re-ramp when VDD drops below 0.2 V or to VSS td(rst) 002aah330 VDD time ramp-down (dV/dt)f ramp-up (dV/dt)r time to re-ramp when VDD drops to VPOR(min) − 50 mV td(rst) VI drops below POR levels |
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