S25FL032P datasheet(33/69 Pages) SPANSION

33 / 69 page

January 29, 2013 S25FL032P_00_09

S25FL032P

Data

Sheet

22h

0Fh

Typical timeout for full chip erase 2

N ms (00h = not supported)

23h

01h

Max. timeout for byte program 2

N times typical

24h

01h

Max. timeout for page program 2N times typical

25h

02h

Max. timeout per individual sector erase 2N times typical

26h

01h

Max. timeout for full chip erase 2N times typical

(00h = not supported)

Table 9.4 Product Group CFI System Interface String

Table 9.5 Product Group CFI Device Geometry Definition

Byte

Data

Description

27h

16h

Device Size = 2 N byte;

28h

05h

Flash Device Interface Description;

00h = x8 only

01h = x16 only

02h = x8/x16 capable

03h = x32 only

04h = Single I/O SPI, 3-byte address

05h = Multi I/O SPI, 3-byte address

29h

05h

2Ah

08h

Max. number of bytes in multi-byte write = 2N

(00 = not supported)

2Bh

00h

2Ch

02h

Number of Erase Block Regions within device

1 = Uniform Device, 2 = Parameter Block

2Dh

1Fh

Erase Block Region 1 Information (refer to CFI publication 100)

2Eh

00h

2Fh

10h

30h

00h

31h

3Dh

Erase Block Region 2 Information (refer to CFI publication 100)

32h

00h

33h

00h

34h

01h

35h

00h

Erase Block Region 3 Information (refer to CFI publication 100)

36h

00h

37h

00h

38h

00h

39h

00h

Erase Block Region 4 Information (refer to CFI publication 100)

3Ah

00h

3Bh

00h

3Ch

00h

S25FL032P Datasheet(PDF) 33 Page - SPANSION

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