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MIC2007YML Datasheet(PDF) 22 Page - Micrel Semiconductor |
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MIC2007YML Datasheet(HTML) 22 Page - Micrel Semiconductor |
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22 / 30 page ![]() Micrel, Inc. MIC20xx Family August 2011 22 M9999-080211-D Variable Undervoltage Lock Out (VUVLO) 2003 2004 2005X 2006 2007 2008 2009X 2013 2014 2015 2016 2017 2018 2019X Only parts in bold have VUVLO. VUVLO functions as an input voltage monitor when the switch in enabled. The VIN pin is monitored for a drop in voltage, indicating excessive loading of the VIN supply. When VIN is less than the VULVO threshold voltage (VVUVLO_TH) for 32ms or more, the MIC20XX disables the switch to protect the supply and allow VIN to recover. After 128ms has elapsed, the MIC20X6 enables switch. This disable and enable cycling will continue as long as VIN deceases below the VUVLO threshold voltage (VVUVLO_TH) which has a typical value of 250mV. The VUVLO voltage is commonly established by a voltage divider from VIN-to-GND. ENABLE 2003 2004 2005X 2006 2007 2008 2009X 2013 2014 2015 2016 2017 2018 2019X Only parts in bold have ENABLE pin. ENABLE pin is a logic compatible input which activates the main MOSFET switch thereby providing power to the VOUT pin. ENABLE is either an active HIGH or active LOW control signal. The MIC20XX can operate with logic running from supply voltages as low as 1.5 V. ENABLE may be driven higher than VIN, but no higher than 5.5V and not less than –0.3V. FAULT/ 2003 2004 2005X 2006 2007 2008 2009X 2013 2014 2015 2016 2017 2018 2019X Only parts in bold have FAULT/ pin. FAULT/ is an N-channel open-drain output, which is asserted (LOW true) when switch either begins current limiting or enters thermal shutdown. FAULT/ asserts after a brief delay when events occur that may be considered possible faults. This delay insures that FAULT/ is asserted only upon valid, enduring, over-current conditions and that transitory event error reports are filtered out. In MIC200X FAULT/ asserts after a brief delay period, of 32ms typical. After a fault clears, FAULT/ remains asserted for the delay period of 32ms MIC201X’s FAULT/ asserts at the end of the Kickstart™ period which is 128ms typical. This masks initial current surges, such as would be seen by a motor load starting up. If the load current remains above the current limit threshold after the Kickstart™ has timed out, then the FAULT/ will be asserted. After a fault clears, FAULT/ remains asserted for the delay of 128ms. Because FAULT/ is an open-drain it must be pulled HIGH with an external resistor and it may be wire-OR’d with other similar outputs, sharing a single pull-up resistor. FAULT/ may be tied to a pull-up voltage source which is higher than VIN, but no greater than 5.5V. Soft-Start Control Large capacitive loads can create significant inrush current surges when charged through the switch. For this reason, the MIC20XX family of switches provides a built-in soft-start control to limit the initial inrush currents. Soft-start is accomplished by controlling the power MOSFET when the ENABLE pin enables the switch. CSLEW 2003 2004 2005X 2006 2007 2008 2009X 2013 2014 2015 2016 2017 2018 2019X Only parts in bold have CSLEW pin. (Not available in 5-pin SOT-23 packages) The CSLEW pin is provided to increase control of the output voltage ramp at turn-on. This input allows designers the option of decreasing the output’s slew rate (slowing the voltage rise) by adding an external capacitance between the CSLEW and VIN pins. Thermal Shutdown Thermal shutdown is employed to protect the MIC20XX family of switches from damage should the die temperature exceed safe operating levels. Thermal shutdown shuts off the output MOSFET and asserts the FAULT/ output if the die temperature reaches 145°C. The switch will automatically resume operation when the die temperature cools down to 135°C. If resumed operation results in reheating of the die, another shutdown cycle will occur and the switch will continue cycling between ON and OFF states until the overcurrent condition has been resolved. Depending on PCB layout, package type, ambient temperature, etc., hundreds of milliseconds may elapse from the incidence of a fault to the output MOSFET being shut off. This delay is due to thermal time constants within the system itself. In no event will the device be damaged due to thermal overload because die temperature is monitored continuously by on-chip circuitry. |
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