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PCM1802DB Datasheet(PDF) 3 Page - Texas Instruments |
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PCM1802DB Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 28 page ![]() www.ti.com ABSOLUTE MAXIMUM RATINGS PCM1802 SLES023C – DECEMBER 2001 – REVISED JANUARY 2005 Terminal Functions TERMINAL I/O DESCRIPTIONS NAME PIN AGND 6 – Analog GND BCK 11 I/O Bit clock input/output(1) BYPAS 8 I HPF bypass control. Low: normal mode (dc cut); High: bypass mode (through)(2) DGND 13 – Digital GND DOUT 12 O Audio data output FMT0 17 I Audio data format select 0. See data format(2) FMT1 18 I Audio data format select 1. See data format(2) FSYNC 9 I/O Frame synchronous clock input/output(1) LRCK 10 I/O Sampling clock input/output(1) MODE0 19 I Mode select 0. See interface mode(2) MODE1 20 I Mode select 1. See interface mode(2) OSR 16 I Oversampling ratio select. Low: ×64 f S; High: ×128 fS (2) PDWN 7 I Power-down control, active-low(2) SCKI 15 I System clock input; 256 fS, 384 fS, 512 fS, or 768 fS(3) VCC 5 – Analog power supply, 5 V VDD 14 – Digital power supply, 3.3 V VINL 1 I Analog input, L-channel VINR 2 I Analog input, R-channel VREF1 3 – Reference-1 decoupling capacitor VREF2 4 – Reference-2 voltage input, normally connected to VCC (1) Schmitt-trigger input (2) Schmitt-trigger input with internal pulldown (50 k Ω typically), 5-V tolerant (3) Schmitt-trigger input, 5-V tolerant over operating free-air temperature range (unless otherwise noted)(1) Supply voltage VCC 6.5 V VDD 4 V Ground voltage differences AGND, DGND ±0.1 V Supply voltage difference VCC, VDD VCC – VDD < 3.0 V Digital input voltage FSYNC, LRCK, BCK, DOUT –0.3 V to (VDD + 0.3 V) PDWN, BYPAS, SCKI, OSR, FMT0, FMT1, MODE0, MODE1 –0.3 V to 6.5 V Analog input voltage VINL, VINR, VREF1, VREF2 –0.3 V to (VCC + 0.3 V) Input current (any pins except supplies) ±10 mA Ambient temperature under bias –40 °C to 125°C Storage temperature –55 °C to 150°C Junction temperature 150 °C Lead temperature (soldering) 260 °C, 5 s Package temperature (IR reflow, peak) 260 °C (1) Stresses beyond those listed under "absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 3 |
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