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ADA4610S Datasheet(PDF) 7 Page - Analog Devices |
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ADA4610S Datasheet(HTML) 7 Page - Analog Devices |
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7 / 18 page ![]() ADA4610S ASD0016547 Rev. A | Page 7 of 18 TABLE IIA – ELECTRICAL TEST REQUIREMENTS: Table IIA Test Requirements Subgroups (in accordance with MIL-PRF-38535, Table III) Interim Electrical Parameters 1 Final Electrical Parameters 1,2,3, 1/ 2/ Group A Test Requirements 1,2,3, Group C end-point electrical parameters 1,2,3, 2/ Group D end-point electrical parameters 1,2,3, Group E end-point electrical parameters 1 3/ Table IIA Notes: 1/ PDA applies to Table I subgroup 1 and Table IIB delta parameters. 2/ See Table IIB for delta parameters 3/ Parameters noted in Table IA, IB are not tested post irradiation. TABLE IIB – LIFE TEST/BURN-IN DELTA LIMITS (+/-VSY = +/-5V & +/-VSY = +/-15V) Table IIB Parameter Symbol Delta Units Offset voltage VOS ±120 µV Input Bias Current VCM = 0V IB ±9.4 pA Supply Current ISY ±0.7 mA 5.0 Burn-In Life Test, and Radiation 5.1. Burn-In Test Circuit, Life Test Circuit 5.1.1.The test conditions and circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 test condition B and alternate test condition D of MIL –STD-883. 5.1.2.HTRB is not applicable for this drawing. 5.2. Radiation Exposure Circuit 5.2.1.The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A. |
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