Electronic Components Datasheet Search
  English  ▼

X  

ADA4610S Datasheet(PDF) 7 Page - Analog Devices

Part # ADA4610S
Description  Low Noise, Precision, Rail to Rail Output, JFET Dual Operational Amplifier
PDF  18 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADA4610S Datasheet(HTML) 7 Page - Analog Devices

Back Button ADA4610S Datasheet HTML 3Page - Analog Devices ADA4610S Datasheet HTML 4Page - Analog Devices ADA4610S Datasheet HTML 5Page - Analog Devices ADA4610S Datasheet HTML 6Page - Analog Devices ADA4610S Datasheet HTML 7Page - Analog Devices ADA4610S Datasheet HTML 8Page - Analog Devices ADA4610S Datasheet HTML 9Page - Analog Devices ADA4610S Datasheet HTML 10Page - Analog Devices ADA4610S Datasheet HTML 11Page - Analog Devices Next Button
Zoom Inzoom in Zoom Outzoom out
 7 / 18 page
background image
ADA4610S
ASD0016547 Rev. A | Page 7 of 18
TABLE IIA – ELECTRICAL TEST REQUIREMENTS:
Table IIA
Test Requirements
Subgroups (in accordance with
MIL-PRF-38535, Table III)
Interim Electrical Parameters
1
Final Electrical Parameters
1,2,3, 1/ 2/
Group A Test Requirements
1,2,3,
Group C end-point electrical parameters
1,2,3, 2/
Group D end-point electrical parameters
1,2,3,
Group E end-point electrical parameters
1 3/
Table IIA Notes:
1/ PDA applies to Table I subgroup 1 and Table IIB delta parameters.
2/ See Table IIB for delta parameters
3/ Parameters noted in Table IA, IB are not tested post irradiation.
TABLE IIB – LIFE TEST/BURN-IN DELTA LIMITS (+/-VSY = +/-5V & +/-VSY = +/-15V)
Table IIB
Parameter
Symbol
Delta
Units
Offset voltage
VOS
±120
µV
Input Bias Current VCM = 0V
IB
±9.4
pA
Supply Current
ISY
±0.7
mA
5.0 Burn-In Life Test, and Radiation
5.1. Burn-In Test Circuit, Life Test Circuit
5.1.1.The test conditions and circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the
intent specified in method 1015 test condition B and alternate test condition D of MIL –STD-883.
5.1.2.HTRB is not applicable for this drawing.
5.2. Radiation Exposure Circuit
5.2.1.The radiation exposure circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing and acquiring activity upon request. Total dose
irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A.



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com