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APA600 Datasheet(PDF) 19 Page - Actel Corporation |
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APA600 Datasheet(HTML) 19 Page - Actel Corporation |
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19 / 178 page ![]() ProASICPLUS Flash Family FPGAs v5.9 2-9 The TAP controller receives two control inputs (TMS and TCK) and generates control and clock signals for the rest of the test logic architecture. On power-up, the TAP controller enters the Test-Logic-Reset state. To guarantee a reset of the controller from any of the possible states, TMS must remain high for five TCK cycles. The TRST pin may also be used to asynchronously place the TAP controller in the Test-Logic-Reset state. ProASICPLUS devices support three types of test data registers: bypass, device identification, and boundary scan. The bypass register is selected when no other register needs to be accessed in a device. This speeds up test data transfer to other devices in a test data path. The 32-bit device identification register is a shift register with four fields (lowest significant byte (LSB), ID number, part number and version). The boundary-scan register observes and controls the state of each I/O pin. Each I/O cell has three boundary-scan register cells, each with a serial-in, serial-out, parallel-in, and parallel-out pin. The serial pins are used to serially connect all the boundary-scan register cells in a device into a boundary- scan register chain, which starts at the TDI pin and ends at the TDO pin. The parallel ports are connected to the internal core logic tile and the input, output, and control ports of an I/O buffer to capture and load data into the register to control or observe the logic state of each I/O. Figure 2-10 • TAP Controller State Diagram Test-Logic Reset Run-Test/ Idle Select-DR- Scan Capture-DR Shift-DR Exit-DR Pause-DR Exit2-DR Update-DR Select-IR- Scan Capture-IR Shift-IR Exit-IR Pause-IR Exit2-IR Update-IR 1 1 1 0 1 0 00 1 1 00 00 1 1 0 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 |
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