THS4524-EP

www.ti.com

SBOS609A – JUNE 2012 – REVISED AUGUST 2013

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERABLE PART

PACKAGE-LEAD

PACKAGE DESIGNATOR

TOP-SIDE MARKING

VID NUMBER

NUMBER

Tape and reel,

THS4524MDBTREP

THS4524EP

V62/12612-01XE

2000

-55°C to 125°C

TSSOP - 38

DBT

Rails, 50

THS4524MDBTEP

THS4524EP

V62/12612-01XE-T

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

THS4524

UNIT

5.5

V

V

1

V

100

mA

10

mA

Continuous Power Dissipation

See Thermal Characteristic Specifications

+150

°C

+125

°C

–55 to 125

°C

–65 to +150

°C

Human Body Model (HBM)

1300

V

ESD

Charge Device Model (CDM)

1000

V

Rating:

Machine Model (MM)

50

V

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-

maximum-rated conditions for extended periods may affect device reliability.

Copyright © 2012–2013, Texas Instruments Incorporated

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