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LMH6643MA Datasheet(PDF) 6 Page - National Semiconductor (TI) |
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LMH6643MA Datasheet(HTML) 6 Page - National Semiconductor (TI) |
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6 / 33 page  LMH6642, LMH6643, LMH6644 SNOS966P – MAY 2001 – REVISED MARCH 2013 www.ti.com ±5V Electrical Characteristics Unless otherwise specified, all limits guaranteed for at TJ = 25°C, V + = 5V, V− = −5V, V CM = VO = 0V, VID (input differential voltage) as noted (where applicable) and RL = 2kΩ to ground. Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min Typ Max Units (1) (2) (1) BW −3dB BW AV = +1, VOUT = 200mVPP 95 130 MHz AV = +2, −1, VOUT = 200mVPP 46 BW0.1dB 0.1dB Gain Flatness AV = +2, RL = 150Ω to V+/2, 12 MHz Rf = 806Ω, VOUT = 200mVPP PBW Full Power Bandwidth AV = +1, −1dB, VOUT = 2VPP 24 MHz en Input-Referred Voltage Noise f = 100kHz 17 nV/ √Hz f = 1kHz 48 in Input-Referred Current Noise f = 100kHz 0.90 pA/ √Hz f = 1kHz 3.3 THD Total Harmonic Distortion f = 5MHz, VO = 2VPP, AV = +2 −62 dBc DG Differential Gain NTSC, AV = +2 0.15 RL = 150Ω to V +/2 % RL = 1kΩ to V +/2 0.01 DP Differential Phase NTSC, AV = +2 0.04 RL = 150Ω to V +/2 deg RL = 1kΩ to V +/2 0.01 CT Rej. Cross-Talk Rejection f = 5MHz, Receiver: 47 dB Rf = Rg = 510Ω, AV = +2 TS Settling Time VO = 2VPP, ±0.1%, 8pF Load, 68 ns VS = 5V SR Slew Rate (3) AV = −1, VI = 2VPP 100 135 V/µs VOS Input Offset Voltage For LMH6642 and LMH6644 ±1 ±5 ±7 mV For LMH6643 ±1 ±3.4 ±7 TC VOS Input Offset Average Drift See (4) ±5 µV/°C IB Input Bias Current See (5) −1.60 −2.60 µA −3.25 IOS Input Offset Current 20 800 nA 1000 RIN Common Mode Input Resistance 3 M Ω CIN Common Mode Input 2 pF Capacitance CMVR Input Common-Mode Voltage CMRR ≥ 50dB −5.5 −5.2 Range −5.1 V 3.8 4.0 3.6 CMRR Common Mode Rejection Ratio VCM Stepped from −5V to 3.5V 74 95 dB AVOL Large Signal Voltage Gain VO = −4.5V to 4.5V, 88 96 RL = 2kΩ 84 dB VO = −4.0V to 4.0V, 78 82 RL = 150Ω 74 VO Output Swing RL = 2kΩ, VID = 200mV 4.90 4.96 V High RL = 150Ω, VID = 200mV 4.65 4.80 Output Swing RL = 2kΩ, VID = −200mV −4.96 −4.90 V Low RL = 150Ω, VID = −200mV −4.80 −4.65 (1) All limits are guaranteed by testing or statistical analysis. (2) Typical values represent the most likely parametric norm. (3) Slew rate is the average of the rising and falling slew rates. (4) Offset voltage average drift determined by dividing the change in VOS at temperature extremes by the total temperature change. (5) Positive current corresponds to current flowing into the device. 6 Submit Documentation Feedback Copyright © 2001–2013, Texas Instruments Incorporated Product Folder Links: LMH6642 LMH6643 LMH6644 |
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