MA31753 datasheet(29/30 Pages) DYNEX

29 / 30 page

MA31753

29/30

RADIATION TOLERANCE

Total Dose Radiation Testing

For product procured to total dose radiation levels, each

wafer lot will be approved when all sample devices pass the

total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

Dynex Semiconductor can provide radiation testing

compliant with MIL STD 883 test method 1019, Ionizing

Radiation (Total Dose).

Total Dose (Function to specification)*

3x10

5 Rad(Si)

Transient Upset (Stored data loss)

1x10

11 Rad(Si)/sec

Transient Upset (Survivability)

>1x10

12 Rad(Si)/sec

Neutron Hardness (Function to specification)

>1x10

15 n/cm2

Single Event Upset**

<1x10

-10 Errors/bit day

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Figure 24: Radiation Hardness Parameters

MA31753 Datasheet(PDF) 29 Page - Dynex Semiconductor