DocID025337 Rev 1

11/29

AN4371

ADC built-in self-test algorithms

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Figure 3. Self-test execution sequence example C and RC in scan mode

Figure 4. Self-test execution sequence flow example S in scan mode

In the case there is required to schedule self-test channel execution in defined sequence the

baud rate is implemented in ADC. This control defines the scheduling of test channel

between the normal conversions. The scheduling rate is specified by STBRR[BR].

Figure 5. Self-test baud rate example C and RC

By default, if test channel is enabled, one Step of selected algorithm is executed after every

chain of normal conversion. STBRR[BR] field provides flexibility by scheduling the test

channel conversion to be performed not at the end of every chain but at the end of BR+1

number of chains.

Note:

This feature is applicable only for scan mode of operation and not for one shot mode. The

STBRR.BR should be set to zero for one shot mode.

2.2

Supply self-test – Algorithm S

Algorithm S consists of 3 steps. Not allowed to be interleaved with normal conversion. At the

end of chain of the normal conversions, (assuming default value of STCR3.ALG) all steps of

Algorithm S are performed (as Algorithm S is always atomic).

MSR.SELF_TEST_S is set.