ADC built-in self-test algorithms

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Figure 9. Test execution flow - Algorithm S

2.3

Resistive-Capacitive self-test - Algorithm RC

Algorithm RC includes a sequence of 19 test conversions (steps) by setting the ADC

internal resistive digital-to-analog converter (DAC).

2.3.1

Resistive-Capacitive self-test in CPU mode

Resistive-Capacitive self-test can be executed either in one shot or scan mode. On

Figure 11 is demonstrated basic test flow. After execution of normal channel the single step

of self-test is executed. This process continues for all Steps of RC algorithm. State Machine

returns to IDLE state when MCR[NSTART] is cleared.

The demonstration example of RC algorithm in one-shot mode is shown on Figure 10. It is

necessary to check self-test result after every step of the conversion.