AN4371 datasheet(20/29 Pages) STMICROELECTRONICS

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Appendix A

AN4371

20/29

DocID025337 Rev 1

Appendix A

Example source code can be found in these appendixes.

3.1

Test Flash copy function example

Read_Self_Test_calibration_data function is necessary to be executed from RAM.

#pragma ghs section text=".ramcode"

void Read_Self_Test_calibration_data (void)

{

uint32_t address = 0x0;

uint32_t i = 0;

/* map Test Flash sector into Flash memory stating 0x0 */

SSCM.SCTR.B.TFE = 1;

for (i=0;i<22;i++)

{

Raw_Test_Flash_Calibration_Data[i] = (*(volatile uint32_t *)address);

address = address + 0x4;

}

SSCM.SCTR.B.TFE = 0;

}

#pragma ghs section

3.2

Algorithm S example in CPU scan mode

void ADC0_SUPPLY_SELF_TEST_ScanMode(void)

{

// Algorithm S

ADC0.MCR.B.PWDN = 0;

// Enable ADC0

/* 1 */

ADC0.MCR.B.CTUEN = 0;

// CPU mode

/* 2 */

ADC0.NCMR[0].B.CH0 = 1;

// ADC0 channel 0 is set. Program NCMR0 to

select channels to be converted for normal conversion

/* 3 */

ADC0.MCR.B.MODE = 1;

// Program MCR[MODE] = 1 to select Scan Mode

mode

/* 4 */

ADC0.STCR1.B.INPSAMP_S = 0xFF;

// Program sampling phase duration for

the test conversions

/* 5 */

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