AN4371 datasheet(23/29 Pages) STMICROELECTRONICS

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AN4371

Appendix A

for(step=0;step<19;step++)

{

ADC0.STCR3.B.MSTEP = step;

// For one-shot mode, defines the current

step for algorithms S

ADC0.MCR.B.NSTART = 1;

// Start ADC0 normal conversion by setting

NSTART bit in the MCR

if (ADC1.STSR1.B.STEP_RC != 0)

{

ADC_Self_Test_Fail[step+6] = 1;

// Check if No RC-algorithm [step]

error has occurred

}

3.4

Algorithm RC example in CPU scan mode

void ADC0_RESISTIVE_CAPACITIVE_SELF_TEST_ScanMode (void)

{

// Algorithm RC

ADC0.MCR.B.PWDN = 0;

// Enable ADC0

/* 1 */

ADC0.MCR.B.CTUEN = 0;

// CPU mode

/* 2 */

ADC0.NCMR[0].B.CH0 = 1;

// ADC0 channel 0 is set. Program NCMR0 to

select channels to be converted for normal conversion

/* 3 */

ADC0.MCR.B.MODE = 1;

// Program MCR[MODE] = 0 to select one scan

mode

/* 4 */

ADC0.STCR1.B.INPSAMP_RC = 0xFF;

// Program sampling phase duration for

the test conversions

/* 5 */

ADC0.STCR3.B.ALG = 0x1;

// Select the RC Self Testing algorithm in

STCR3.ALG. Default is Algorithm S

/* 6 */

ADC0.STCR2.B.EN = 1;

// ADC0 Enable self testing channel by setting

EN bit in the STCR2 register

/* 7 */

ADC0.STAW3R.B.AWDE = 1;

// Enable analog watchdog related to the

algorithm RC

/* 8 */

ADC0.STAW3R.B.THRL = ADC0_Self_Test_Flash_Calibration_Data[0]; // ADC0

Self-Test calibration - RC algo - Low Treshold Value

ADC0.STAW3R.B.THRH = ADC0_Self_Test_Flash_Calibration_Data[1]; // ADC0

Self-Test calibration - RC algo - High Treshold Value

/* 9 */

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