ADC built-in self-test algorithms

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2.4

Capacitive self-test - Algorithm C

Capacitive Self-test Algorithm C includes a sequence of 17 test conversions (steps) by

setting the capacitive elements comprising the sampling capacitor/ capacitive DAC. This

algorithm is designed to highlight faults in the sampling capacitor matrix. Each step

considers two elements of the sampling capacitor matrix. For each step a sequence of pre-

sampling, sampling and evaluation phases are executed.

2.4.1

Capacitive self-test in CPU mode

Figure 12 demonstrating basic self-test flow for algorithm C in one-shot mode.

After executing each step of the self-test the error bit STSR1[STEP_C] is checked.