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AN3324 Datasheet(PDF) 19 Page - STMicroelectronics

Part # AN3324
Description  Implementing power-on self tests
PDF  37 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3324 Datasheet(HTML) 19 Page - STMicroelectronics

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AN3324
Module software requirements for non applicative peripherals
Doc ID 18311 Rev 2
19/37
registers have to be configure (NCF_CFG0, NCFS_CFG0, NCF_TOE0, etc.). Loss of lock
signals from FMPLL_0 and FMPLL_1 provide the FCCU “Non-Critical Fault” inputs 2 and 3.
Note:
The RGM and FCCU configuration includes the reaction in case of FMPLL loss of lock. This
reaction is application-dependent.
3.9
Internal RC Oscillator (IRCOSC)
User has to verify the availability and frequency of the internal RC oscillator and for this
reason the frequency meter of the CMU0 (see Section 3.7: Clock Monitor Unit (CMU)) must
be exploited.
User has to use this feature to measure the RC oscillator frequency using the external
oscillator clock as known one and compare it to the expected one (16MHz(d)).
Note:
The reference clock is always the XOSC. The measure starts when CMU_CSR[SFM] is set.
The measurement duration is given by the CMU_MDR register in terms of IRC clock cycles
with a width of 20 bits. The SFM bit is cleared by the hardware after the frequency
measurement is done and the count is loaded in the CMU_FDR.
The frequency FRC can be derived from the value loaded in the CMU_FDR register (FRC =
(FOSC × MD) / n) where n is the value in CMU_FDR register and MD is the value in
CMU_MDR.
Note:
Safety related modules which work on the RC clock are: FCCU and SWT. In case of RC
clock failure, these modules stop working.
3.10
Flash memory
To support the detection of dormant faults in the entire memory array and addressing logic,
user must execute array integrity self check (see Section 3.10.1: Array integrity self check
procedure).
This BIST is based on functionality built into the Flash control logic. It calculates a MISR
signature over the array content and thus validates the content of the array as well as the
decoder logic. The calculated MISR value is dependent on the array content and must be
validated by application software.
For self check during boot, user has to do the array integrity check over the entire area
except over the sectors used for EEPROM (Electrically Erasable Programmable Read Only
Memory) emulation as only one of the sectors used for EEPROM contains valid data and
that the data in this sector varies during ECU (Electronic Control Unit) life time.
Note:
This BIST must be started by application software; its result must be validated by reading
the corresponding registers in the Flash Controller after it has been finished. Refer to the
“Array integrity self check” section in the “Flash memory” chapter of RM0032 (see B.1:
Reference documents in Appendix B) for detailed informations about this BIST.
d.
The internal RC oscillator nominal frequency is 16 MHz, but a post trim accuracy of ±6% overvoltage and
temperature must be taken into account.



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