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LTC1297DI Datasheet(PDF) 18 Page - Linear Technology |
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LTC1297DI Datasheet(HTML) 18 Page - Linear Technology |
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18 / 24 page ![]() 18 LTC1292/LTC1297 S APPLICATI I FOR ATIO Figures 17 and 18 show examples of both adequate and poor settling. Using a slower CLK will allow more time for the reference to settle. Even at the maximum CLK rate of 1MHz most references and op amps can be made to settle within the 1 µs bit time. For example the LT1027 will settle adequately. With a 10 µF bypass capacitor at VREF the LT1021 can also be used. Reduced Reference Operation The effective resolution of the LTC1292/LTC1297 can be increased by reducing the input span of the con- verter. The LTC1292/LTC1297 exhibit good linearity over a range of reference voltages (see typical perfor- mance characteristics curves of Change in Linearity vs Reference Voltage). Care must be taken when operat- ing at low values of VREF because of the reduced LSB step size and the resulting higher accuracy requirement placed on the converter. Offset and noise are factors that must be considered when operating at low VREF values. The internal reference for VREF has been tied to the GND pin. Any voltage drop from the GND pin to the ground plane will cause a gain error. Offset with Reduced VREF The offset of the LTC1292/LTC1297 has a larger effect on the output code when the A/D is operated with a reduced reference voltage. The offset (which is typi- cally a fixed voltage) becomes a larger fraction of an LSB as the size of the LSB is reduced. The typical performance characteristics curve of Unadjusted Off- set Error vs Reference Voltage shows how offset in LSBs is related to reference voltage for a typical value of VOS. For example a VOS of 0.1mV, which is 0.1LSB with a 5V reference becomes 0.4LSB with a 1.25V reference. If this offset is unacceptable, it can be corrected digitally by the receiving system or by offset- ting the –IN input to the LTC1292/LTC1297. Noise with Reduced VREF The total input referred noise of the LTC1292/LTC1297 can be reduced to approximately 200 µVP-P using a ground plane, good bypassing, good layout techniques and minimizing noise on the reference inputs. This noise is insignificant with a 5V reference input but will version technique (see Figure 16). During each bit test of the conversion (every CLK cycle) a capacitive current spike will be generated on the reference pin by the A/D. These current spikes settle quickly and do not cause a problem. If slow settling circuitry is used to drive the reference input, take care to insure that transients caused by these current spikes settle completely during each bit test of the conversion. RON 8pF TO 40pF LTC1292 LTC1297 REF+ ROUT VREF EVERY CLK CYCLE 14 13 REF – LTC1292/7 F16 Figure 16. Reference Input Equivalent Circuit HORIZONTAL: 1 µs/DIV Figure 17. Adequate Reference Settling (LT1027) HORIZONTAL: 10 µs/DIV Figure 18. Poor Reference Settling Can Cause A/D Errors |
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