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WF5028 Datasheet(PDF) 11 Page - Nippon Precision Circuits Inc |
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WF5028 Datasheet(HTML) 11 Page - Nippon Precision Circuits Inc |
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11 / 13 page ![]() WF5028 series SEIKO NPC CORPORATION —11 TYPICAL PERFORMANCE The following characteristics measured using the crystal below. Note that the characteristics will vary with the crystal used. I Crystal used for measurement I Crystal parameters Current Consumption Negative Resistance Frequency Deviation by Supply Voltage Change Drive Level Parameter fO = 48MHz C0 [pF] 1.6 R1 [ Ω]12 L1 C0 R1 C1 5028 ×1, fOSC = 48MHz, fOUT = 48MHz, Ta = 25°C 0.5 1.0 1.5 2.0 VDD [V] 5 4 3 2 1 0 CL = 15pF No load 5028 ×1, VDD = 0.9V, Ta = 25°C Characteristics are measured with a capacitance C0, representing the crystal equivalent circuit C0 capacitance, connected between the XT and XTN pins. Measurements are performed with Agilent 4396B using the NPC test jig. Characteristics may vary with measurement jig and measurement conditions. −600 −400 −200 0 −800 −1000 0 204060 80 100 Frequency [MHz] C0 = 0pF C0 = 1pF C0 = 2pF 5028 ×1, CL = 15pF, 1.2V standard, Ta = 25°C 0.5 1.0 1.5 2.0 VDD [V] f = 48MHz −4 0 4 8 12 −8 −12 5028 ×1, fOSC = 48MHz, Ta = 25°C 0.5 1.0 1.5 2.0 VDD [V] f = 48MHz 0 50 100 200 150 |
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