Data Sheet

11

Rev. 1.4, 2014-10-28

TLE8209-2

Power Supply

CONFIG0=’0’: ABE is inactive after VDD returned to normal operating voltage and filtering time has expired.

At the transition from overvoltage to normal condition, the output stages will return to normal operation. For output

control via SPI the bits MUX and SINx in the config register have to be re-programmed. New failures are not stored

to diagnostic registers during overvoltage, register content remains valid, writing new information to configure

registers is possible as far as they are not reset by ABE.

VDD Monitoring Test Mode

Testing of VDD monitoring is possible in SPI mode only. The latch function for over voltage at VDD has to be

switched of (CONFIG0=0 in STATCON_REG)

Testing upper threshold:

By writing 00xxxxxxb into STATCON_REG, the overvoltage threshold is reduced to VDD_TEST_H.

STATCON_REG bit 2 and 0 have to be LOW then. After writing 1xxxxxxxb to STATCON_REG, bit 2 and 0 in

STATCON_REG must be HIGH again

Testing lower threshold:

By writing 01xxxxxxb into STATCON_REG, the undervoltage threshold is increased to VDD_TEST_L.

STATCON_REG bit 2 and 1 have to be LOW then. After writing 1xxxxxxxb to STATCON_REG, bit 2 and 1 in

STATCON_REG must be HIGH again.

5.3

VDDIO - Digital Output Supply and Diagnostic Mode Selection

The voltage at

V

pin is also used to select SPI- or in status flag (SF) diagnostic mode. As soon as

V

device is put into status flag mode.

.

Figure 5

V

to internal logic

(SF-mode / SPI-mode)

from internal logic

SO

+

-

SF/SPI - mode

VDDIO