KAI-04050 datasheet(22/49 Pages) ONSEMI

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KAI-04050 Image Sensor

www.truesenseimaging.com

Revision 5.0 PS-0009 Pg. 22

Operation Conditions for Defect Testing at 27 °C

Description

Condition

Notes

Operational Mode

Two outputs, using VOUTa and VOUTc, continuous readout

HCCD Clock Frequency

20 MHz

Pixels Per Line

2560

Lines Per Frame

992

Line Time

131.5 μsec

Frame Time

130.4 msec

Photodiode Integration Time

(PD_Tint)

Mode A: PD_Tint = Frame Time = 130.4msec, no electronic shutter used

Mode B: PD_Tint = 33 msec, electronic shutter used

VCCD Integration Time

118.2 msec

Temperature

27 °C

Light Source

Continuous red, green and blue LED illumination

Operation

Nominal operating voltages and timing

Notes

Horizontal overclocking used

Vertical overclocking used

VCCD Integration Time = 900 lines x Line Time, which is the total time a pixel will spend in the VCCD registers.

For monochrome sensor, only the green LED is used.

Defect Definitions for Testing at 27 °C

Description

Definition

Standard Grade

Grade 2

Notes

Major dark field defective

bright pixel

PD_Tint = Mode A  Defect ≥ 14 mV

PD_Tint = Mode B  Defect ≥ 4 mV

Major bright field defective

dark pixel

Defect ≥ 12%

Cluster Defect

A group of 2 to 10 contiguous major defective

pixels, but no more than 2 adjacent defects

horizontally.

n/a

Cluster Defect

(Grade 2)

A group of 2 to 10 contiguous major defective

pixels

n/a

Column defect

A group of more than 10 contiguous major

defective pixels along a single column

Notes:

For the color device (KAI-04050-FBA, KAI-04050-CBA, KAI-04050-QBA, or KAI-04050-PBA), a bright field defective pixel

deviates by 12% with respect to pixels of the same color.

Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel

defects).

Defect Map

The defect map supplied with each sensor is based upon testing at an ambient (27°C) temperature. Minor point defects

are not included in the defect map. All defective pixels are reference to pixel 1, 1 in the defect maps. See Figure 13:

Regions of Interest for the location of pixel 1, 1.

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