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KAI-04050 Datasheet(PDF) 23 Page - ON Semiconductor |
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KAI-04050 Datasheet(HTML) 23 Page - ON Semiconductor |
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23 / 49 page ![]() KAI-04050 Image Sensor www.truesenseimaging.com Revision 5.0 PS-0009 Pg. 23 Test Definitions TEST REGIONS OF INTEREST Image Area ROI: Pixel (1, 1) to Pixel (2360, 1776) Active Area ROI: Pixel (13, 13) to Pixel (2348, 1764) Center ROI: Pixel (1131, 839) to Pixel (1230, 938) Only the Active Area ROI pixels are used for performance and defect tests. OVERCLOCKING The test system timing is configured such that the sensor is overclocked in both the vertical and horizontal directions. See Figure 13 for a pictorial representation of the regions of interest. Figure 13: Regions of Interest 12 buffer rows 12 buffer rows 12 dark rows VOUTa 12 dark rows 2336 x 1752 Active Pixels 1, 1 13, 13 Pixel Pixel VOUTc |
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