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GS1670 Datasheet(PDF) 119 Page - Semtech Corporation

Part # GS1670
Description  HD/SD SDI Receiver Complete with SMPTE Audio and Video Processing
PDF  126 Pages
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Manufacturer  SEMTECH [Semtech Corporation]
Direct Link  http://www.semtech.com
Logo SEMTECH - Semtech Corporation

GS1670 Datasheet(HTML) 119 Page - Semtech Corporation

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GS1670 HD/SD SDI Receiver
Data Sheet
53831 - 2
September 2012
119 of 126
4.21 JTAG Test Operation
When the JTAG/HOST pin of the GS1670 is set HIGH, the host interface port is
configured for JTAG test operation. In this mode, pins E7, F8, F7, and E8 become TDO,
TCK, TMS, and TDI. In addition, the RESET_TRST pin operates as the test reset pin.
Boundary scan testing using the JTAG interface is enabled in this mode.
There are two ways in which JTAG can be used:
1. As a stand-alone JTAG interface to be used at in-circuit ATE (Automatic Test
Equipment) during PCB assembly.
2. Under control of a host processor for applications such as system power on self
tests.
When the JTAG tests are applied by ATE, care must be taken to disable any other devices
driving the digital I/O pins. If the tests are to be applied only at ATE, this can be
accomplished with tri-state buffers used in conjunction with the JTAG/HOST input
signal. This is shown in Figure 4-43.
Figure 4-43: In-Circuit JTAG
Alternatively, if the test capabilities are to be used in the system, the host processor may
still control the JTAG/HOST input signal, but some means for tri-stating the host must
exist in order to use the interface at ATE. This is represented in Figure 4-44.
Figure 4-44: System JTAG
Scan coverage is limited to digital pins only. There is no scan coverage for analog pins
VCO, SDO/SDO, RSET, LF, and CP_RES.
The JTAG/HOST pin must be held LOW during scan and therefore has no scan coverage.
Please contact your Semtech representative to obtain the BSDL model for the GS1670.
Application HOST
CS_TMS
SCLK_TCK
SDIN_TDI
SDOUT_TDO
JTAG_HOST
In-circuit ATE probe
GS1670
Application HOST
CS_TMS
SCLK_TCK
SDIN_TDI
SDOUT_TDO
JTAG_HOST
In-circuit ATE probe
Tri-State
GS1670



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